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Abstract ▼ AI-Helper

This paper presents the implementation of comparator which are Fail-Safe with respect to faults caused by any single physical defect likely to occur in NMOS and CMOS integrated circuit. The goal is to use it at the Fail-Safe system. First, a new fault model for PLA(Programmable Logic Array) is prese...

This paper presents the implementation of comparator which are Fail-Safe with respect to faults caused by any single physical defect likely to occur in NMOS and CMOS integrated circuit. The goal is to use it at the Fail-Safe system. First, a new fault model for PLA(Programmable Logic Array) is presented. This model reflects several physical defects in VLSI circuits. It focuses on designs based on PLA because VLSI chips are far too complex to allow detailed analysis of all the possible physical defects that can occur and of the effects on the operation of the circuit. Second, this paper show that these design, which was implemented with 2 level AND_ORor NOR-NOR circuit, are optimal in term of size. And it also present a formal proof that a comparator implemented as NOR-NOR PLA, based on these design, is self-testing with respect to most single faults in the presented fault model. Finally, it discuss the application of the self-testing comparator as a building block for implementing Fail-Safe Adder.