The surface evenness and texture are closely related with the irregularity of yam thickness. Besides, yam thickness variation has an important role to influence the yam performance and the textile process efficiency. Thus, the information not only on the yam thickness, but also on the short- term irregular characteristics that have not been known before is required for enhancing the qualities of textile products. This paper reports the results of a study about the yam thickness and its variation for various types of yam on the basis of a new measurement system applying a laser slit beam as a light source. The new method delivers effective information on the irregularity. The analysis of the measured signal confirms that the visual shade created by the yam doubling and twisting can be measured and the yam thickness characteristics can be represented by correlograms. Depending on yam types, correlograms have different shapes and can be approximated to an exponentially decaying function with or without fluctuating magnitude. In addition, the effective information on the yam irregularity can be influenced by the sampling length interval of the measuring device used for tests.
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