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NTIS 바로가기한국정밀공학회지 = Journal of the Korean Society for Precision Engineering, v.24 no.10 = no.199, 2007년, pp.99 - 108
정재학 (LG 이노텍 부품연구소) , 김한바라 (LG 생산기술원 디자인엔지니어링 그룹) , 승용호 (LG 전자 MC 연구소) , 최현호 (LG 이노텍 부품연구소)
As the structure of a mobile phone becomes thin to catch up with a slim product trend, the reliability of a LCD module is on the rise as a big issue for a product design. A drop test is the most basic and important verification method for a mechanical quality control but it requires much time and co...
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Korean Agency for Technology and Standards, 'Shock Testing Procedure for Electric Machines and Equipment,' Korean Industrial Standards (KS C 0905), 2006
Wu, J., Song, G, Yeh, C. P. and Wyatt, K., 'Drop/Impact Simulation and Test Validation of Telecommunication products,' Inter. Society Conference on Thermal Phenomena, pp. 330 -336, 1998
Choi, S. S., Kang, E. and Kim, D. C., 'Drop Impact Simulation for Optimum Design of TFT-LCD,' 5th International LS-DYNA Users Conference, 1998
Kim, H. B. R., 'A Study of case breakage for folder type cellular phone with in case of opened and closed,' PAM Users Conference in Korea, HANPAM 2004, Session A, 2004
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ESI GROUP, ' $PAM-CRASH^{TM}$ $PAM-SAFE^{TM}$ 2005 Solver Notes Manual,' ESI GROUP, 2005
ESI GROUP, ' $PAM-CRASH^{TM}$ $PAM-SAFE^{TM}$ 2005 Solver Reference Manual,' ESI GROUP, 2005
Wu, J., Song, G, Yeh, C. P. and Wyatt, K., 'Drop/Impact Simulation and Test Validation in Motorola,' 5th International LS-DYNA Users Conference, 1998
Takada, S. and Musha, A., 'Mobile-phone Structural Design Technology,' MITSUBISHI ELECTRIC ADVANCE, Vol. 102, pp. 18-20,2003
Lim, C. T., Teo, Y. M. and Shim, V. P. W., 'Numerical Simulation of the Drop Impact Response of a Portable Electronic Product,' IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, Vol. 25, No.3, pp. 478-485, 2002
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