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NTIS 바로가기Microprocessors and microsystems, v.35 no.5, 2011년, pp.453 - 461
Kim, M.H. (Department of Control and Instrumentation Engineering, Pukyong National University, Busan, South Korea) , Lee, S. (Department of Control and Instrumentation Engineering, Pukyong National University, Busan, South Korea) , Lee, K.C.
Safety issues and the dependence of numerous systems on electronics are rapidly increasing the concern over fault-tolerance. As an example, an intelligent vehicle with electronically controlled x-by-wire systems composed of dynamically configurable electronic elements instead of rigid me...
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