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NTIS 바로가기Scanning, v.35 no.6, 2013년, pp.355 - 361
Postek, Michael T. (National Institute of Standards and Technology, Gaithersburg, Maryland) , Vladár, András E. (National Institute of Standards and Technology, Gaithersburg, Maryland)
SummaryThe scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantitative applications especially for nanotechn...
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