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NTIS 바로가기Ultramicroscopy, v.168, 2016년, pp.1 - 6
Mu, X. , Wang, D. , Feng, T. , Kubel, C.
Characterizing heterogeneous nanostructured amorphous materials is a challenging topic, because of difficulty to solve disordered atomic arrangement in nanometer scale. We developed a new transmission electron microscopy (TEM) method to enable phase analysis and mapping of heterogeneous amorphous st...
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