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Surface measurement instruments 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-007/28
출원번호 US-0616130 (1975-09-24)
우선권정보 UK-0041561 (1974-09-24)
발명자 / 주소
  • Siddall Graham John (Keyworth EN) Player Michael Antony (Aberdeen SC)
출원인 / 주소
  • The Rank Organisation Limited (London EN 03)
인용정보 피인용 횟수 : 43  인용 특허 : 0

초록

A method of determining the coordinates of the center of curvature of the curved surface of a workpiece on a surface measurement instrument of the type having a workpiece table rotatably mounted on a main spindle, and a sensor for contacting the surface of a workpiece mounted on the table. The metho

대표청구항

A method of determining the coordinates of the centre of curvature of the curved surface of a workpiece with respect to a predetermined frame of reference the origin of which coincides with the centre of relative rotation between the workpiece and a sensor of a surface measurement instrument of the

이 특허를 인용한 특허 (43)

  1. Niedermayr Erich (Munich DEX), Apparatus for determining the deviations from a circular form in a dynamically balanced part.
  2. Ackley, H. Sprague, Automatic mode switching in a volume dimensioner.
  3. Ackley, H. Sprague, Automatic mode switching in a volume dimensioner.
  4. Ackley, H. Sprague; McCloskey, Scott, Calibrating a volume dimensioner.
  5. Ackley, H. Sprague; McCloskey, Scott, Calibrating a volume dimensioner.
  6. Todeschini, Erik; Jovanovski, Brian L.; Bremer, Edward C., Depth sensor based auto-focus system for an indicia scanner.
  7. Todeschini, Erik; Jovanovski, Brian L.; Bremer, Edward C., Depth sensor based auto-focus system for an indicia scanner.
  8. Todeschini, Erik; Jovanovski, Brian L.; Bremer, Edward C., Depth sensor based auto-focus system for an indicia scanner.
  9. Todeschini, Erik; Jovanovski, Brian L.; Bremer, Edward C., Depth sensor based auto-focus system for an indicia scanner.
  10. Moriyasu Takashi (Yokohama JPX), Device for measuring the shape of a three-dimensional object.
  11. Todeschini, Erik, Dimensioning and imaging items.
  12. Todeschini, Erik, Dimensioning and imaging items.
  13. Laffargue, Franck; Hunt, Jeffrey, Dimensioning system with feedback.
  14. Li, Jingquan; Jovanovski, Brian L.; McCloskey, Scott; Lloyd, Ryan Andrew, Dimensioning system with guided alignment.
  15. Rhyner Hans-Ulrich (Dbendorf CHX), Displacement detecting system in a multi-axis measuring system, especially for use with a gear wheel grinding or inspect.
  16. Thuries, Serge, High resolution dot pattern.
  17. Kinoshita, Takashi; Mizuta, Yoshiki; Yamada, Takahiro; Ueda, Shogo; Kudo, Eiji; Kimura, Yuichi; Sangawa, Yukio, Hole center detecting apparatus, straightness measuring apparatus, and residual torsion measuring apparatus.
  18. Kinoshita, Takashi; Mizuta, Yoshiki; Yamada, Takahiro; Ueda, Shogo; Kudo, Eiji; Kimura, Yuichi; Sangawa, Yukio, Hole center detecting apparatus, straightness measuring apparatus, and residual torsion measuring apparatus.
  19. Kinoshita,Takashi; Mizuta,Yoshiki; Yamada,Takahiro; Ueda,Shogo; Kudo,Eiji; Kimura,Yuichi; Sangawa,Yukio, Hole center detecting apparatus, straightness measuring apparatus, and residual torsion measuring apparatus.
  20. McCloskey, Scott; Lloyd, Ryan Andrew, Image transformation for indicia reading.
  21. Jovanovski, Brian L.; Li, Jingquan, Image-stitching for dimensioning.
  22. Jovanovski, Brian L.; Li, Jingquan, Image-stitching for dimensioning.
  23. Mezzasalma Orazio (Edificio Parque Florida 45N Avenida Avila ; La Florida Caracas-105 VEX), Lens measuring method and apparatus.
  24. Showering, Paul Edward, Measuring object dimensions using mobile computer.
  25. Showering, Paul Edward, Measuring object dimensions using mobile computer.
  26. Asakura Kouichi (Tokyo JPX) Sagara Makoto (Shizuoka JPX), Method and apparatus for determining axes of cylindrical blanks.
  27. Spencer Robert M. (San Juan Capistrano CA) Lada Christopher O. (Palo Alto CA), Method and system for locating and positioning circular workpieces.
  28. Dutler Werner (Haag CHX), Method for automatic compensation of probe offset in a coordinate measuring machine.
  29. Anton Dukart DE; Franz Jost DE, Method for compensating the offset of angle sensors.
  30. Whitehouse David J. (Melton Mowbray GB2) Sharma Harish C. (Leicester GB2), Method of determining the coordinates of the center of curvature of the curved surface of a workpiece.
  31. Jovanovski, Brian L.; Li, Jingquan, Method of error correction for 3D imaging device.
  32. Jovanovski, Brian L.; Li, Jingquan, Method of error correction for 3D imaging device.
  33. Jovanovski, Brian L.; Li, Jingquan, Method of error correction for 3D imaging device.
  34. Grosvenor Roger I. (Cardiff GB7), Methods and apparatus for measuring transverse dimensions of workpieces.
  35. Ackley, H. Sprague, Mobile dimensioner apparatus for use in commerce.
  36. Ackley, H. Sprague, Mobile dimensioner apparatus for use in commerce.
  37. Thuries, Serge; Gillet, Alain; Puybras, Bernard, Optical pattern projector.
  38. Lloyd, Ryan Andrew; McCloskey, Scott, Scene change detection in a dimensioner.
  39. Lloyd, Ryan Andrew; McCloskey, Scott, Scene change detection in a dimensioner.
  40. Houle, Scott Xavier; Hunt, Jeffrey Mark, Vehicle positioning and object avoidance.
  41. Houle, Scott Xavier; Hunt, Jeffrey Mark, Vehicle positioning and object avoidance.
  42. Hunt, Jeffrey Mark; Jennings, Edward J.; Wojack, Nancy; Houle, Scott Xavier, Volume dimensioning systems and methods.
  43. Hunt, Jeffrey Mark; Jennings, Edward J.; Wojack, Nancy; Houle, Scott Xavier, Volume dimensioning systems and methods.
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