[특허]Multiple-frequency permittivity tester

Multiple-frequency permittivity tester 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01R-027/26
출원번호	US-0697858 (1976-06-21)
발명자 / 주소	Vogel Ronald F. (Bettendorf IA) Boldt Robert R. (Taylor Ridge IL) McKee Kevin D. (Davenport IA) Resh Roy E. (Bettendorf IA) West Paul E. (Davenport IA)
출원인 / 주소	Agridustrial Electronics, Inc. (Bettendorf IA 02)
인용정보	피인용 횟수 : 52 인용 특허 : 0

초록 ▼

As in prior testers, a capacitive cell in which material is placed to be tested is connected in a voltage divider circuit. However, signal generating means connected to the voltage divider applies voltages at different predetermined frequencies selected for the material being tested, and frequency selective means connected to the cell develop voltages at the applied frequencies having values dependent on the impedance of the filled cell at the respective frequencies. These voltages developed across the cell are applied to a computer that provides an output according to an equation that has been derived statistically from many samples of the material being tested for the substance or quality of the material being measured.

대표청구항 ▼

An electrical testing system having an output that is a function of the permittivity of materials for determining qualities of the materials, comprising: generating means for exciting periodic electrical waves at a plurality of frequencies, said generating means having signal selective circuits for supplying said waves at respective predetermined ones of said frequencies, a capacitive cell to receive materials for testing, the capacitive impedance of said cell being dependent on the complex permittivity of material placed therein, said signal selective circuits of said generating means connected to said capacitive cell to apply thereto said periodic electrical waves at said predetermined frequencies, output selective circuits connected to said capacitive cell for receiving voltages developed thereacross, said output selective circuits having different output circuits responsive to application of voltages at different ones of said predetermined frequencies for developing different output voltages therein in response to application thereto of said voltages developed across said capacitive cell, the magnitudes of said different output voltages varying systematically in accordance with different impedances of said cell at different ones of said predetermined frequencies, computing means connected to said output circuits of said output selective circuits, said output circuits applying said different output voltages to said computing means, and said computing means being programmed to provide in response to application thereto of said different output voltages an output indicative of the amount of a particular quality associated with the material being tested.

이 특허를 인용한 특허 (52)

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Melcher ; deceased James R., Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations.
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Melcher James R. (Lexington MA) Zaretsky Mark C. (Brooklyn NY), Apparatus and methods for measuring permittivity in materials.
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Goldfine Neil J. ; Melcher ; deceased James R., Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using.
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Wardle Jay M., Group delay estimate system using least square fit to phase response ramp.
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Capots Larry H. (Annandale VA), Identification of materials using their complex dielectric response.
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Gregory William D. (Vienna VA) Morelli Luigi (Sterling VA), Identification of materials using their complex dielectric response.
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Adams Brian T. ; Karlmann Thomas ; Hale George H. ; Schubert William L., Method and apparatus measuring parameters of material.
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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

내보내기 구분	파일저장 인쇄 메일전송
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연합인증

Multiple-frequency permittivity tester 원문보기

초록 ▼

대표청구항 ▼

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이 특허를 인용한 특허 (52)

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Multiple-frequency permittivity tester 원문보기

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이 특허를 인용한 특허 (52)

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