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Binary inspection probe for numerically controlled machine tools 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-007/00
  • G01B-007/28
출원번호 US-0805914 (1978-06-13)
발명자 / 주소
  • Kirkham
  • Edward E.
출원인 / 주소
  • Kearney & Trecker Corporation
대리인 / 주소
    Hajewski, Cyril M.
인용정보 피인용 횟수 : 49  인용 특허 : 0

초록

An inspection probe is mounted in the spindle of a numerically controlled machine tool and is moved toward a workpiece therein by the numerical controls until it makes contact with the workpiece. Contact with the workpiece is indicated by change in the output signal of a portable transmitter mounted

대표청구항

대표청구항이 없습니다.

이 특허를 인용한 특허 (49)

  1. Kitamura Koichiro (Takaoka JPX), Apparatus for detecting the position of a machine tool spindle.
  2. Turner C. Warren (Auburn WA) Trammell Larry L. (Federal Way WA) Hametner Albert L. (Seattle WA), Automated shim manufacturing system.
  3. Etoh Kunihiko (Toyota JPX) Owa Kaoru (Nukata JPX) Nakashima Kunimichi (Anjoh JPX), Automatic centering controller for a machine tool.
  4. Nakaso Toru (Nagoya JPX) Nomura Kenji (Aichi JPX) Nakashima Kunimichi (Anjo JPX), Control system for a machine tool.
  5. Shimizu Giichiro (Tokyo JPX) Shimizu Misao (Tokyo JPX) Takeuchi Hajime (Tokyo JPX) Okuyama Toshiharu (Tokyo JPX) Wakatsuki Yoshio (Tokyo JPX), Data collecting system.
  6. Shimizu Giichiro (Tokyo JPX) Shimizu Misao (Tokyo JPX) Takeuchi Hajime (Tokyo JPX) Okuyama Toshiharu (Tokyo JPX) Wakatuski Yoshio (Tokyo JPX), Data-transmitting apparatus having connecting plug.
  7. Garland French, Gage for determining the true dead center of a workpiece on a lathe or milling machine from each tool pocket in the machine tool turret or cross slide.
  8. Thompson Robert A. (Quaker Street NY) Breuning Richard W. (Scotia NY), In-process cutting tool condition compensation and part inspection.
  9. Atkinson David A. (Parkersburg WV), Inspection device for containers.
  10. Lehmkuhl Robert A. (Madison NJ), Intelligent tool system.
  11. Nower Daniel L. (Knoxville TN) Gaddis David Q. (Knoxville TN), Laser alignment head for use in shaft alignment.
  12. Angel, Avigdor; Benedik, Ran, Live tool collar having wireless sensor.
  13. Juengel Richard O. (Romeo MI), Low battery detector for a machine system using infrared telemetry.
  14. Juengel, Richard O., Machine system using infrared telemetering.
  15. Watanabe, Noboru, Machine tool.
  16. Angel, Avigdor; Books, Baruch; Benedik, Ran, Machining center, fluid driven spindle system, machining center conversion kit, and method using wireless sensor for access control.
  17. Clark Earl S. (Coventry RI), Measurement system with remote display.
  18. Parsons John T. (205 Wellington Traverse City MI 49684), Meltable matrix chucking machining center and process using.
  19. Juengel Richard O. (Romeo MI), Method and apparatus for performing workpiece inspection with a probe.
  20. Breyer Karl-Hermann (Heidenheim DEX) Schepperle Karl (Oberkochen DEX) Georgi Bernd (Oberkochen DEX) Wimmer Martin (Steinheim DEX), Method and means for controlling a coordinate-measuring instrument.
  21. Coleman, Richard M.; McCrum, Russell C., Method for assessing accuracy of positioning of a multi-axis numerically controlled machine.
  22. Sutherland Alexander T,GBX, Method of and apparatus for measuring workpieces using a coordinate positioning machine.
  23. Matsunata Yuso (Hiroshima JPX), Method of compensating a profiling direction of a profiling machine.
  24. Deis, Jerome E., Method of making coordinate measurements.
  25. Lane Hugh R. (Leicester GBX) Onyon Peter D. (Loughborough GBX), Metrological apparatus.
  26. Kanemoto Masakazu (Gotenba JPX) Yoshida Tetsu (Numazu JPX) Kamahora Fumio (Susono JPX), Numerical controlled machine tool making intermediate measurements.
  27. McMurtry, David R., Numerically controlled machine tool.
  28. Juengel Richard O. (Romeo MI), Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter.
  29. Nilsson Gunnar (Eskilstuna SEX), Position indicator for control measurements of surfaces.
  30. Manns Paul A. (Rochester MI) Juengel Richard O. (Romeo MI), Probe.
  31. Cusack, Robert F., Probe adjustment tool and method of using same.
  32. May James D. (Enfield CT) Gosselin Charles E. (Manchester CT), Probe for coordinate measuring machine.
  33. Tomita Yutaka (Kanagawa JPX) Shibagaki Akiro (Kanagawa JPX), Probe tracing method and means for coordinate measuring machine.
  34. Cusack Robert F. (Grosse Pointe MI), Probe with stylus adjustment.
  35. Juengel Richard O. (Romeo MI), Prober with optical transmission scheme.
  36. Pouyet, Jean, Process for acquiring data representative of the shape of an object.
  37. Coleman, Richard M.; McCrum, Russell C., Process for qualifying accuracy of a numerically controlled machining system.
  38. Prinz Reinhard,DEX, Sensing system for coordinate measuring equipment.
  39. Barlow, Allan R.; Hunter, William A., System and method of precision machining.
  40. Juengel Richard O. (Romeo MI) Begin John D. (Warren MI) Khalaf John (Livonia MI), Telemetry gage system.
  41. Davies David L. (Guilford CT), Three dimensional graphics tablet.
  42. Zurbrick John R. (Cincinnati OH) Kelley John R. (Cincinnati OH), Tool touch probe system and method of precision machining.
  43. Cusack Robert F. (Grosse Pointe MI), Touch probe.
  44. Juengel Richard O. (Romeo MI), Touch probe using microwave transmission.
  45. Jonas, Kevyn Barry; McFarland, Geoffrey, Use of surface measurement probes.
  46. Milosevic, Milan; Milosevic, Violet, Video imaging device with an integrated battery.
  47. Rosenbeck William H. (Torrington CT) Eckart Frederick (Southington CT) Gerath Francis C. (Collinsville CT 4), Welding system for contour joints.
  48. Yasuhiro Komai JP; Yukio Masuda JP, Working machine and its communication method.
  49. Moulton ; III James E. (Porter Corners NY), Zero load thickness caliper.
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