초록 ▼

A surface inspection system has a light beam repetitively scanning a surface and a receiver located to receive light specularly (directly) reflected. The receiver has an enclosure with a wall containing a plurality of slits by which reflected light can reach a detector in the enclosure. The slits ar

A surface inspection system has a light beam repetitively scanning a surface and a receiver located to receive light specularly (directly) reflected. The receiver has an enclosure with a wall containing a plurality of slits by which reflected light can reach a detector in the enclosure. The slits are arranged to cause the detector to produce a series of pulses throughout the scan, each pulse providing an instantaneous picture of the surface gloss in terms of an intensity distribution, the half width of each pulse is measured to give an indication of any variation from the half width of the distribution for a known surface gloss.

대표청구항 ▼

A surface inspection system for measuring the gloss of a surface caused to move past the system including a transmitting station from which a beam of light is directed onto the surface and caused to scan repetitively across the surface, a receiving station comprising a detector of light, an enclosur

A surface inspection system for measuring the gloss of a surface caused to move past the system including a transmitting station from which a beam of light is directed onto the surface and caused to scan repetitively across the surface, a receiving station comprising a detector of light, an enclosure containing the detector extending across the surface and having a plurality of slits in one wall thereof by which light may reach the detector, the one wall extending so that the slits are arranged to receive light reflected at the specular angle and the slits being spaced apart such that the reflected bean enters each slit in turn to produce from the detector a succession of detector pulses each having the characteristic features of the gloss of the surface under test, and measuring means operable to measure the duration of the detector pulses at a predetermined level with respect to the amplitude of each pulse to produce a signal indicative of the gloss of the part of the surface giving rise to that pulse.