초록 ▼

A modular-type integrated circuit burn-in apparatus including a power supply for developing integrated circuit biasing potentials, an oven and a plurality of modules each having a plug-in pattern generator for generating integrated circuit exercising signals of a type programmed by a first plug-in h

A modular-type integrated circuit burn-in apparatus including a power supply for developing integrated circuit biasing potentials, an oven and a plurality of modules each having a plug-in pattern generator for generating integrated circuit exercising signals of a type programmed by a first plug-in header, a plurality of driver cards for fault monitoring and for developing amplified exercising signals on output pins programmed by a second plug-in header, a plurality of socket cards carrying the integrated circuits to be burned-in, and with said modules being removably disposed in a rear wall of the oven having connectors on the outside of the oven for receiving the pattern generator and the driver cards, and connectors on the inside of the oven for receiving the socket cards, the modules being operative to couple the power from the power supply to the pattern generator and the driver cards, the exercising signals from the pattern generator to the driver cards, and the amplified exercising signals and power from the driver cards to the socket cards whereby the type of exercising signals and routing of the power and exercising signal are programmed by the headers as required by the type of integrated circuits to be burned-in.

대표청구항 ▼

A system for generating exercising signals for an integrated circuit burn-in apparatus comprising: power supply means for developing integrated circuit biasing potentials; an oven for receiving a plurality of integrated circuits to be burned-in; a plurality of modules each having a plug-in pattern g

A system for generating exercising signals for an integrated circuit burn-in apparatus comprising: power supply means for developing integrated circuit biasing potentials; an oven for receiving a plurality of integrated circuits to be burned-in; a plurality of modules each having a plug-in pattern generator for generating integrated circuit exercising signals of a type programmed by a first plug-in header; a plurality of driver cards for fault monitoring and for developing amplified exercising signals on output terminals programmed by a second plug-in header; a plurality of socket cards for carrying the integrated circuits to be burned-in, and a module removably disposed in a rear wall of the oven, the module having connectors on the outside of the oven for receiving the pattern generator and the driver cards and connectors on the inside of the oven for receiving the socket cards, the module being operative to couple the power from the power supply means to the pattern generator and the driver cards, to couple the exercising signals from the pattern generator to the driver cards, and to couple the amplified exercising signals and power from the driver cards to the socket cards whereby the type of exercising signals and routing of the power and exercising signal are programmed by the headers as required by the type of integrated circuits to be burned-in.