초록 ▼

A circuit for sensor-controlled distance measurement with two linear image sensors is disclosed. These sensors are exposed to lines corresponding to two images derived from one object. The sensor signals are subjected to correlation measurements, from which the range of the object is determined. An

A circuit for sensor-controlled distance measurement with two linear image sensors is disclosed. These sensors are exposed to lines corresponding to two images derived from one object. The sensor signals are subjected to correlation measurements, from which the range of the object is determined. An exposure-measuring circuit determines the optimum integration time of the sensor elements. In the case of such circuits, one sets as exact a distance measurement as possible. For this purpose, comparing sensor elements of the exposure-measuring circuit, which are provided with a mean value of the exposure of many sensor locations, are designed such that they extend only over a part of the sensor lines. They are arranged in a sequence which runs along the entire sensor line. A separate controlling of the optimum integration time proceeds over individual line portions. A range of application for the invention encompasses photographic and electronic cameras.

대표청구항 ▼

A circuit having an exposure measuring portion and designed for sensor-controlled range measurement, comprising: two linear semiconductor image sensors having sensor elements; means for projecting line segments corresponding to two images separately obtained from an object onto the corresponding ima

A circuit having an exposure measuring portion and designed for sensor-controlled range measurement, comprising: two linear semiconductor image sensors having sensor elements; means for projecting line segments corresponding to two images separately obtained from an object onto the corresponding image sensors; an evaluator means connected to each of the sensor elements for switching between two different states depending upon whether a reference charge in the sensor elements is exceeded so as to digitalize sensor signals; an evaluating circuit means for evaluating the digitalized sensor signals in dependence upon varying relative position shifts with respect to a maximum correlation; device means connected to the evaluating circuit means for evaluating a range of said object; means for determining integration time of the sensor elements including strip-shaped comparing sensor elements positioned for exposure to an optically generated charge quantity which corresponds to a plurality of sensor elements in at least one of the image sensors; said comparing sensor elements being arranged along a longitudinal axis parallel to said at least one image sensor; dimensions of the individual comparing sensor elements along the longitudinal axis being substantially smaller than a corresponding dimension of the at least one image sensor; and each of the individual comparing sensor elements being connected via an evaluator means to associated inputs of a gate circuit means, an output of which represents an output of an exposure measuring portion which is formed of said comparing sensor elements, associated evaluator means, and gate circuit means, said evaluator means switching between two different states depending on whether a reference charge in the comparing sensor element is exceeded.