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Shape testing apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/00
출원번호 US-0181768 (1980-08-27)
우선권정보 JP-0111706 (1979-09-03); JP-0146427 (1979-11-14); JP-0107193 (1980-08-06)
발명자 / 주소
  • Nakagawa Yasuo (Yokohama JPX) Makihira Hiroshi (Yokohama JPX) Oshida Yoshitada (Fujisawa JPX) Akiyama Nobuyuki (Yokohama JPX)
출원인 / 주소
  • Hitachi, Ltd. (Tokyo JPX 03)
인용정보 피인용 횟수 : 31  인용 특허 : 2

초록

A shape detecting apparatus comprises a slit projecting means for projecting a slit image on a three-dimensional object such as a soldered area, a positioning means for positioning the three-dimensional object relative to the slit projecting means, an image pickup means for two-dimensionally scannin

대표청구항

A shape detecting apparatus comprising: (a) a slit projecting means for projecting a slit image on a three-dimensional object; (b) a positioning means for positioning said three-dimensional object relative to said slit projecting means; (c) an image pickup means for two-dimensionally scanning the sl

이 특허에 인용된 특허 (2)

  1. Kuni Asahiro (Tokyo JPX) Akiyama Nobuyuki (Yokohama JPX) Oshima Yoshimasa (Yokohama JPX), Apparatus for automatically checking external appearance of object.
  2. Karasaki Koichi (Hadano JPX) Hara Yasuhiko (Yokohama JPX), Method and apparatus for inspecting printed wiring boards.

이 특허를 인용한 특허 (31)

  1. Murai Shunji (Hachiouji JPX) Ohtomo Fumio (Kawagoe JPX) Ohtani Hitoshi (Tokyo JPX), Apparatus and method for determining the coordinates of a three-dimensional object.
  2. Mattila Timo (Kausala FIX), Apparatus for identifying and recording bottles and/or bottle hampers.
  3. Schorcht Adelbrecht (Jena DDX) Klingenfeld Dietmar (Jena DDX) Hesse Reiner (Jena-Lobeda DDX) Dastis Rainer (Jena-Lobeda DDX) Linz Volker (Jena-Lobeda DDX), Arrangement for the automatic adjustment of at least one object.
  4. DiMatteo Paul (Huntington NY), Arrangement of eliminating erroneous data in three-dimensional optical sensors.
  5. Spina, Mario J.; Desiderio, Anthony M., Body spatial dimension mapper.
  6. Clerget Michel (La Celle Saint Cloud FRX) Germain Francois (Limours FRX) Kryze Jiri (Pontchartrain FRX) Poujois Robert (Sinard FRX), Device for the determination of the position of points on the surface of a body.
  7. Kara Gerald F. (Gravette AR) Sawyer William H. (Chester Springs PA), Inspection and measuring apparatus and method.
  8. Vikterlf Karl-Johan (Vrbovgen 14 702 30 rebro SEX) Palsgard Gte (Eklundavgen 34 A 702 17 rebro SEX), Means for registering coordinates.
  9. Ray Rajarshi (Princeton NJ), Method and apparatus for inspecting articles.
  10. Ohtomo Fumio (Asaka JPX) Otani Hitoshi (Tokyo JPX), Method and apparatus for measuring coordinates.
  11. Sinclair Michael J. ; Vitz Frank E., Method and apparatus for optically digitizing a three-dimensional object.
  12. Stern Howard ; Maali Fereydoun, Method and system for imaging an object or pattern.
  13. Stern, Howard; Maali, Fereydoun, Method and system for imaging an object or pattern.
  14. Liu Kuo-Ching ; Liang Chu-Kwo ; Fwu Jong-Kae ; Huang Chung-Po, Method and system for measuring object features.
  15. Kodama, Hiroaki; Kubo, Tetsuo; Miwa, Sinkichi, Method for inspecting crimp bonded terminals.
  16. Hallerman,Gregory R.; Ludlow,Jonathan E.; Stern,Howard K., Method for three-dimensional inspection using patterned light projection.
  17. Kobayashi Shigeki (Shiga JPX) Takahara Hideaki (Kyoto JPX), Method of and apparatus for inspecting printed circuit boards and the like.
  18. Homma Kazuya (Tokyo JPX) Nogi Hiroshi (Tokyo JPX) Yamada Koichi (Tokyo JPX) Kitazume Masahiro (Tokyo JPX) Uzawa Masamitsu (Tokyo JPX) Aoki Makoto (Tokyo JPX), Method of and apparatus for measuring irregularities of road surface.
  19. Wood George A. (Nashua NH), Method of automatically measuring the shape of a continuous surface.
  20. Franco Danielli IT, Optoelectric apparatus for the dimension and/or shape checking of pieces with complex tridimensional shape.
  21. Hara Yasuhiko (Machida JPX) Karasaki Koichi (Hadano JPX) Ujiie Noriaki (Katsuta JPX) Sase Akira (Katsuta JPX), Pattern detecting apparatus.
  22. Nakagawa Yasuo (Chigasaki JPX) Ninomiya Takanori (Yokohama JPX), Robot system for recognizing three dimensional shapes.
  23. Ninomiya Takanori (Yokohama JPX) Nakagawa Yasuo (Chigasaki JPX), Robot vision system.
  24. Liudzius Valerie A. (Simi Valley CA) Weisner Ralph M. (Canoga Park CA) Kamiharako Takashi (Tokyo JPX) Uramoto Iwami (Tokyo JPX), Semiconductor device inspection system.
  25. Dewar Robert (Troy MI) Salinger Jeremy (Southfield MI) Waldecker Thomas J. (Ypsilanti MI) Barlow Neil E. (Royal Oak MI), Sensor-illumination system for use in three-dimensional measurement of objects and assemblies of objects.
  26. Nakatsukasa, Takashi, Shape measuring device, shape measuring method, and shape measuring program.
  27. Ito Giichi (Koganei JPX) Mukai Kousaku (Tokyo JPX) Shimizu Yuichi (Koganei JPX) Suzuki Saiju (Chofu JPX), Shape measuring instrument.
  28. Okamoto Shinji (Yawata JPX) Yoshimura Kazunari (Yawata JPX) Nakahara Tomoharu (Nishinomiya JPX), Soldering inspection system and method therefor.
  29. Braun Paul A. (Simi Valley CA) Ormsby Michael W. (Thousand Oaks CA) De Zotell Gary L. (Simi Valley CA), System and method for analyzing dimensions of can tops during manufacture.
  30. Bouchard Donald R. (Endicott NY) Danton John L. (Endicott NY) Dawson Kevin A. (Endicott NY) Sloma David J. (Johnson City NY), Video measuring system for defining location orthogonally.
  31. Dusel Robert O. (Brookfield WI) Keene Harold J. (Milwaukee WI), Wire processing apparatus having control means.
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