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Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B32B-003/00
출원번호 US-0363477 (1982-03-30)
우선권정보 JP-0065564 (1981-04-30); JP-0065565 (1981-04-30); JP-0065566 (1981-04-30)
발명자 / 주소
  • Negishi Isamu (Ina JPX) Hunyu Kazumi (Omiya JPX)
출원인 / 주소
  • Fujikura Rubber Works, Ltd. (Tokyo JPX 03)
인용정보 피인용 횟수 : 98  인용 특허 : 4

초록

A base fabric for polyurethane-coated fabics which comprises a layer of polyurethane prepolymer under half cross-linked conditions partially formed on at least one surface of the water repellent-unfinished fabric. A process for the production of a base fabric for polyurethane-coated fabrics, which c

대표청구항

A process for the production of base fabric for polyurethane-coated fabrics, which comprises partially coating a solution of polyurethane prepolymer containing a cross-linking agent on at least one surface of a water repellent-unfinished fabric at coverage rate of 10 to 30 g/m2, drying at a temperat

이 특허에 인용된 특허 (4)

  1. Lyons Harold D. (Spartanburg SC), Breathable leather-like materials and process for making same.
  2. Thoma Wilhelm (Leverkusen DEX) Berndt Gerhard (Monheim DEX) Pedain Josef (Cologne DEX) Schrer Walter (Leverkusen DEX) Kling Waldemar (Kuerten-Bechen DEX), Heat cross linkable polyurethane coating compositions.
  3. Matthews Virgil Edison (Charleston WV) Knopf Robert John (Saint Albans WV), Lightly cross-linked polyurethane hydrogels based on poly(alkylene ether) polyols.
  4. Wolfrey Austin A. (Peabody MA), Polyurethane resin coating composition.

이 특허를 인용한 특허 (98)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  3. Dunklee, John, Chuck for holding a device under test.
  4. Dunklee, John, Chuck for holding a device under test.
  5. Dunklee, John, Chuck for holding a device under test.
  6. Dunklee,John, Chuck for holding a device under test.
  7. Dunklee,John, Chuck for holding a device under test.
  8. Dunklee,John, Chuck for holding a device under test.
  9. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  10. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  11. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  12. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  13. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  14. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  15. Strid, Eric; Campbell, Richard, Differential signal probing system.
  16. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  17. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  18. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  19. Kerr Richard C. (Rutherfordton NC) Damewood John R. (Spartanburg SC) Menzel Jill (Spartanburg SC) Thottathil Paul (New Hyde Park NY) Sanduja Mohan L. (Flushing NY), Fabric containing graft polymer thereon.
  20. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  21. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
  22. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  23. McFadden,Bruce, Localizing a temperature of a device for testing.
  24. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  25. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  26. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  27. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  28. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  29. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  30. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  31. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  32. Siegel, Dan G.; Nelson, Kevin Philip; Pockat, Gregory Robert; Schell, Thomas Andrew; Berbert, Otacilio Teixeira; Michaud, Ryan Arthur; Mengel, Matthew LeRoy; Latreille, Douglas Mark, Method for distributing a myoglobin-containing food product.
  33. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  34. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  35. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  36. Watabe Nobuo (Tokyo JPX), Moisture-permeable sheets.
  37. Pockat, Gregory Robert; Schell, Thomas Andrew; Siegel, Dan G.; Nelson, Kevin Philip; Berbert, Otacilio Teixeira, Myoglobin blooming agent containing shrink films, packages and methods for packaging.
  38. Siegel, Dan G.; Berbert, Otacilio Teixeira; Nelson, Kevin Philip; Pockat, Gregory Robert, Myoglobin blooming agents, films, packages and methods for packaging.
  39. Elesh James N. (Evanston IL), Nylon or polyester treated fabric for bedding.
  40. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  41. Harris,Daniel L.; McCann,Peter R., Optical testing device.
  42. Siegel, Dan G.; Nelson, Kevin Philip, Packaging articles, films and methods that promote or preserve the desirable color of meat.
  43. Siegel, Dan G.; Nelson, Kevin Philip, Packaging articles, films and methods that promote or preserve the desirable color of meat.
  44. Mengel, Matthew LeRoy; Latreille, Douglas Mark; Siegel, Dan G., Packaging inserts with myoglobin blooming agents, packages and methods for packaging.
  45. Mengel, Matthew LeRoy; Latreille, Douglas Mark; Siegel, Dan G., Packaging inserts with myoglobin blooming agents, packages and methods of packaging.
  46. Szycher Michael (Lynnfield MA) Rolfe Jonathan L. (North Easton MA), Perfume patch.
  47. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  48. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  49. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  50. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  51. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  52. Schwindt,Randy, Probe holder for testing of a test device.
  53. Nordgren, Greg; Dunklee, John, Probe station.
  54. Nordgren, Greg; Dunklee, John, Probe station.
  55. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  56. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  57. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  58. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  59. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  60. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  61. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  62. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  63. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  64. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  65. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  66. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  67. Lesher, Timothy E., Probe testing structure.
  68. Lesher,Timothy E., Probe testing structure.
  69. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  70. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  71. Welch Gloria, Reusable wall covering.
  72. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  73. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  74. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  75. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  76. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  77. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  78. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  79. Dunklee,John, Switched suspended conductor and connection.
  80. Dunklee,John, Switched suspended conductor and connection.
  81. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  82. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  83. Andrews, Peter; Hess, David, System for testing semiconductors.
  84. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  85. Campbell, Richard, Test structure and probe for differential signals.
  86. Campbell,Richard, Test structure and probe for differential signals.
  87. Rumbaugh,Scott, Thermal optical chuck.
  88. Rumbaugh,Scott, Thermal optical chuck.
  89. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  90. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  91. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  92. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  93. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  94. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  95. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  96. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  97. Siegel, Dan G.; Nelson, Kevin Philip; Michaud, Ryan Arthur, Webs with synergists that promote or preserve the desirable color of meat.
  98. Campbell, Richard, Wideband active-passive differential signal probe.
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