|국가/구분||United States(US) Patent 등록|
|발명자 / 주소|
|출원인 / 주소|
|인용정보||피인용 횟수 : 18 인용 특허 : 1|
An optical scanning system provides an intensity-modulated, illuminated spot for contour measurements using phase detection. Two semiconductor lasers, which are thermally coupled but are electrically isolated, transmit light beams which are translated and separately collimated by the optics of the system. The collimated beams are then combined on adjacent reflecting facets of a rotating polyhedron to form a narrow beam which illuminates a small spot at relatively high intensity. The beam scans across the target surface over an angle of 120 degrees.
An apparatus for forming a single scanning beam of light from two separated light sources, said apparatus comprising: first lens means responsive to said light sources for providing first and second light beams collimated in a first direction; optical transmission means for translating and separating said first and second collimated light beams; second lens means responsive to said translated and separated first and second collimated light beams for providing third and fourth light beams collimated in a second direction, said second direction being ortho...