초록 ▼

An image scanning method, comprising providing an array of intercalated odd and even detectors, said odd detectors and said even detectors being aligned parallely to a common direction, displacing said array over said image transversely to said direction, repeatedly serially sampling element signals

An image scanning method, comprising providing an array of intercalated odd and even detectors, said odd detectors and said even detectors being aligned parallely to a common direction, displacing said array over said image transversely to said direction, repeatedly serially sampling element signals from said detectors, each indicative of the intensity detected by a corresponding detector over an element part of the image, and serially transferring into an image signal a sequence of said element signals sampled from said odd detectors and a sequence said element signal sampled from said even detectors alternately.

대표청구항 ▼

An image scanning method, comprising: providing a linear array of intercalated odd and even detectors arranged in a column, displacing said array over said image transversely to the direction of alignment of the detectors in said column, repeatedly serially sampling element signals from said detecto

An image scanning method, comprising: providing a linear array of intercalated odd and even detectors arranged in a column, displacing said array over said image transversely to the direction of alignment of the detectors in said column, repeatedly serially sampling element signals from said detectors, each indicative of the intensity detected by a corresponding detector over an element part of the image, each odd detector of the array being sampled alternatively with an even detector, but several odd detectors being sampled before the first even detector adjacent to a sampled odd detector is sampled, and serially transferring into an image signal alternatively a first sequence of said element signals sampled from said odd detector and a second sequence of said element signals sampled from said even detectors, wherein the sampling of the element signals is timely controlled so that the time interval between sampling adjacent odd and even detectors is half the time period for sampling the complete array.