$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

High speed scanning method and apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/24
  • G01C-025/00
  • H04N-007/02
출원번호 US-0426840 (1982-09-29)
발명자 / 주소
  • White Steven J. (Seattle WA)
출원인 / 주소
  • Technical Arts Corporation (Seattle WA 02)
인용정보 피인용 횟수 : 48  인용 특허 : 6

초록

A method and apparatus for determining the spatial coordinates of a workpiece including: a precisely formed jig; a planar light source; an electronic imaging device adapted to view the intersection of the planar light with the jig and the workpiece; a video digitizer for sampling and digitizing outp

대표청구항

A method for determining spatial coordinates of a workpiece, comprising the steps of: (a) illuminating said workpiece and a jig with a planar source of light, said jig inherently defining a geometric figure; (b) storing the dimensions of the geometric figure inherent in said jig; (c) electronically

이 특허에 인용된 특허 (6)

  1. Kosmowski, Wojciech; Eddy, Richard; O'Neill, Martin, Apparatus for determining the parameters of figures on a surface.
  2. Chasson Leon H. (Los Altos Hills CA), Method and apparatus for automatically processing a workpiece employing calibrated scanning.
  3. Sanford Norman R. (Piqua OH), Method and apparatus for detecting characteristic features of surfaces.
  4. Michaud Jimmie A. (Bellbrook OH), Method and apparatus for determining the position of a body.
  5. Pinkney Harold F. L. (Ottawa CAX) Perratt Charles I. (Ottawa CAX), Method and apparatus of determining the center of area or centroid of a geometrical area of unspecified shape lying in a.
  6. Procter Samuel Anderson (Minneapolis MN), Metrological TV microscope.

이 특허를 인용한 특허 (48)

  1. Hasili Jacob P. (Hamilton Township ; Mercer County NJ), Apparatus and method for measuring and displaying the pulse width of a video signal.
  2. Schmitt, Peter; Kostka, Gunther; Scholz, Oliver, Apparatus and method for measuring the surface of a body.
  3. Martinschledde,Ludger; Herrmann,Guenter; Eckstein,Juergen; Krauhausen,Michael, Apparatus for and method of measurements of components.
  4. Leong Kenneth (Burnaby CAX) Stewart Donald (Langley CAX), Apparatus for determining the distances of points on a surface from a reference axis.
  5. Han, Rae-Hee; Sung, Ki-Sung; Kim, Jeong-Chan, Automatic sheet grinding apparatus.
  6. Heesemann Juergen (Bad Oeynhausen DEX), Belt grinding machine.
  7. Johnston, Kyle S.; Bass, Charles M., Calibration for 3D measurement system.
  8. Mueller,Frederick; Miramonti,John L.; Shi,Jianbo, Calibration ring for developing and aligning view dependent image maps with 3-D surface data.
  9. Coatney Charles W. (Reno NV), Color measuring and control device.
  10. Weber, Georg, Continuous grinding machine.
  11. Johnston, Kyle S.; Franklin, Joseph A.; Nelson, Spencer G.; Bass, Charles M., Determination of the angular position of a laser beam.
  12. Herrmann,Guenter; Hilbk Kortenbruck,Frank, Device and method for measuring components.
  13. Portegys, Thomas Edward, Distance measuring device using a method of spanning separately targeted endpoints.
  14. Takenaka, Shintaro, Drive circuit of solid-state image pickup device, method of driving solid-state image pickup device and image pickup system of solid-state image pickup device.
  15. Keightley, John Howard; Cunha, Adriano Goncalves; Dumont, Mark Aurele Louis, Hand-held surface profiler.
  16. Clary, Thomas R.; Franklin, Joseph A.; Johnston, Kyle S.; Ridge, Joseph D., High precision optical imaging systems and related systems.
  17. Mitrani, Eduardo N., In vitro micro-organs, and uses related thereto.
  18. Bartko Robert J. (Shelby Township MI) Rosen Jack H. (Farmington Hills MI), Intelligent sensor method and apparatus for an optical wheel alignment machine.
  19. Bartko Robert J. ; Rosen Jack H., Intelligent sensor method and apparatus for an optical wheel alignment machine.
  20. Tsikos Constantine J. (65 Woodstone Dr. West Berlin NJ 08091-1049), Laser range imaging system based on projective geometry.
  21. Hoogenboom Leo (Ballston Spa NY) Jackson ; Jr. Robert L. (Schenectady NY) Kraft Russell P. (Averill Park NY) Offt Alan M. (Clifton Park NY), Machine vision differential measurement system.
  22. Vikterlf Karl-Johan (Vrbovgen 14 702 30 rebro SEX) Palsgard Gte (Eklundavgen 34 A 702 17 rebro SEX), Means for registering coordinates.
  23. Johannesson,Mattias; Nilsson,Fredrik; Gunnarsson,Karl Gunnar, Measuring apparatus and method in a distribution system.
  24. Goulding John R. ; Kiest Cary S. ; LaChapelle Joseph G., Method and apparatus for feature detection in a workpiece.
  25. Woods Steve C.,CAX ; McGuire Michael,CAX ; Ogloff Harry,CAX ; Skocic Zvonimr,CAX ; Johnson Emeric,CAX, Method and apparatus for improved inspection and classification of attributes of a workpiece.
  26. Williams Daryl N. (Mount Waverley AUX), Method and apparatus for the optical determination of surface profiles.
  27. Maruyama Tsugito (Machida JPX) Kanda Shinji (Yokohama JPX) Hanahara Keishi (Yamato JPX), Method for measuring a three-dimensional position of an object.
  28. Niemelä, Pekka; Väänänen, Eero, Method for measuring the surface height of a material bed conducted on a conveyor belt to thermal treatment.
  29. Horvath Horst H. (Karlsruhe DEX), Method for monitoring the width of material in strip form.
  30. Rosenthal Robert D. (Gaithersburg MD), Near-infrared apparatus and method for determining percent fat in a body.
  31. Koerner Arthur ; Hanson James, Non-contact method and apparatus for determining camber and caster of a vehicle wheel.
  32. Burke Victor B. (1692 Kingsley Ave. Akron OH 44313), Noncontact gage system utilizing reflected light.
  33. Rosenthal Robert D. (Gaithersburg MD), Optical quantitative analysis using curvilinear interpolation.
  34. Chiu Ming-Yee (Mt. Laurel NJ) Devinney ; Jr. Edward J. (Delanco NJ), Optical system for inspecting printed circuit boards wherein a ramp filter is disposed between reflected beam and photod.
  35. Johnston, Kyle S.; Lock, Tomas E.; Clary, Thomas R.; Nelson, Spencer G.; Greenberg, Heath M., Profiling of a component having reduced sensitivity to anomalous off-axis reflections.
  36. Johnston, Kyle S.; Lock, Tomas E.; Clary, Thomas R.; Nelson, Spencer G.; Greenberg, Heath M., Profiling of a component having reduced sensitivity to anomalous off-axis reflections.
  37. Kyle S. Johnston ; Tomas E. Lock ; Thomas R. Clary ; Spencer G. Nelson ; Heath M. Greenberg, Profiling of a component having reduced sensitivity to anomalous off-axis reflections.
  38. Haisch,Michael; Monz,Ludwin, Stereomicroscopy method and stereomicroscopy system.
  39. Yabe, Tomoyoshi, Surface inspection system for work boards.
  40. Michael, David J.; Wallack, Aaron S., System and method for high-accuracy measurement of object surface displacement using a laser displacement sensor.
  41. Grimson W. Eric L. ; White Steven J. ; Ettinger Gil J. ; Wells ; III William M. ; Lozano-Perez Tomas ; Kikinis Ronald, System and method of registration of three-dimensional data sets.
  42. Weinreb Arye (Jerusalem ILX) Deutsch Mordechai (Moshav Olesh ILX), System and methods for cell selection.
  43. Luminari Massimo (Lesmo ITX), System for detecting and correcting defects in articles being processed, in particular wood panels with splits, knot-hol.
  44. Matsui Shogo (Sagamihara JPX) Shiozawa Kunihiko (Yokohama JPX) Kobayashi Kenichi (Tokyo JPX), System for inspecting exposure pattern data of semiconductor integrated circuit device.
  45. Crabb Robert M. (Endicott NY) DeFoster Steven M. (Binghamton NY) Rittenhouse Norman E. (Endicott NY) West Mark A. (Binghamton NY) Ziegler Richard A. (Vestal NY), System for measuring and detecting printed circuit wiring defects.
  46. Taniguti Ryosuke (Nagasaki JPX) Kohmo Hidenori (Nagasaki JPX) Kubo Manabu (Nagasaki JPX) Ikeda Takashi (Nagasaki JPX), System for measuring three-dimensional coordinates.
  47. Yurii Olegovich Yakovlev RU; Vladimir Ivanovich Grigorievsky RU; Astrelin Andrey Vitalievich RU; Alex Veniaminovitch Sherstuk RU; Petr M. Petrov, Three dimensional optical scanner.
  48. Johnson William K. (Ft. Collins CO) May Roger A. (Winter Park FL), Window generator.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로