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Fuel economizing device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F23D-021/00
출원번호 US-0615581 (1984-05-31)
발명자 / 주소
  • Roman Frank (Star Rte. 113 Long Pond PA 18334)
인용정보 피인용 횟수 : 72  인용 특허 : 1

초록

An internal combustion engine fuel economizing device is disclosed. A cylinder having an inlet and an outlet is installed between the fuel pump and the carburetor. Fuel discharged from the fuel pump enters the cylinder inlet through an inlet conduit. The fuel stream is filtered by a filtering device

대표청구항

A fuel economizing device for internal combustion engines comprising: (a) a cylinder having generally a length of about 2.25 inch and a diameter of about 0.75 inch, said cylinder also having an inlet at one end and an outlet at the opposite end; (b) a conduit, said conduit mated at its one end to sa

이 특허에 인용된 특허 (1)

  1. Reed Morgan P. (700 South Eastern Rayne LA 70578), Fuel heater.

이 특허를 인용한 특허 (72)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  3. Dunklee, John, Chuck for holding a device under test.
  4. Dunklee, John, Chuck for holding a device under test.
  5. Dunklee, John, Chuck for holding a device under test.
  6. Dunklee,John, Chuck for holding a device under test.
  7. Dunklee,John, Chuck for holding a device under test.
  8. Dunklee,John, Chuck for holding a device under test.
  9. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  10. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  11. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  12. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  13. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  14. Strid, Eric; Campbell, Richard, Differential signal probing system.
  15. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  16. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  17. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  18. Jones Wallace R. (5702 Trails Edge Ct. Arlington TX 76017), Fuel treatment device.
  19. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  20. McFadden,Bruce, Localizing a temperature of a device for testing.
  21. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  22. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  23. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  24. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  25. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  26. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  27. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  28. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  29. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  30. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  31. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  32. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  33. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  34. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  35. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  36. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  37. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  38. Schwindt,Randy, Probe holder for testing of a test device.
  39. Nordgren, Greg; Dunklee, John, Probe station.
  40. Nordgren, Greg; Dunklee, John, Probe station.
  41. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  42. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  43. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  44. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  45. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  46. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  47. Lesher, Timothy E., Probe testing structure.
  48. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  49. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  50. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  51. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  52. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  53. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  54. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  55. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  56. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  57. Dunklee,John, Switched suspended conductor and connection.
  58. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  59. Andrews, Peter; Hess, David, System for testing semiconductors.
  60. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  61. Campbell, Richard, Test structure and probe for differential signals.
  62. Campbell,Richard, Test structure and probe for differential signals.
  63. Rumbaugh,Scott, Thermal optical chuck.
  64. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  65. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  66. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  67. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  68. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  69. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  70. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  71. Brotea Paul A. (1091 Gilliard La. Ventura CA 93001) Tufts Robert J. (728 Colina Vista Ventura CA 93003), Water removal device for fuel systems.
  72. Campbell, Richard, Wideband active-passive differential signal probe.
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