초록 ▼

Disclosed is an image scanning system including signal integration type image sensor, measuring device for measuring a light substantially equivalent to a light incident on the sensor, and a controller for controlling the signal integration time of the sensor on the basis of the output of the sensor

Disclosed is an image scanning system including signal integration type image sensor, measuring device for measuring a light substantially equivalent to a light incident on the sensor, and a controller for controlling the signal integration time of the sensor on the basis of the output of the sensor and the output of the measuring device, the controller determining an initial signal integration time on the basis of the output of the measuring device and thereafter stepwise controlling the signal integration time on the basis of the output of the sensor with the initial integration time as the starting point.

대표청구항 ▼

A radiation sensing system comprising: (A) signal integration type radiation sensing means responsive to radiation and arranged to produce an electrical output indicative of the integration of the received radiation during a signal integration time; (B) radiation measuring means arranged to measure

A radiation sensing system comprising: (A) signal integration type radiation sensing means responsive to radiation and arranged to produce an electrical output indicative of the integration of the received radiation during a signal integration time; (B) radiation measuring means arranged to measure radiation substantially equivalent to the radiation which said sensing means receives, said measuring means producing an electrical output indicative of the intensity of the received radiation; and (C) signal integration time control means for controlling the signal integration time of said sensing means on the basis of the outputs of said measuring means and said sensing means, wherein said signal integration time control means is arranged to determine an initial signal integration time of said sensing means on the basis of the output of said measuring means.