초록 ▼

Apparatus for scanning a document includes an array of light emitting diodes, or optical fibers, arranged across the width of the document and extending further than its edges, a corresponding array of photo-diodes, or fiber optics connected to photo-diodes, for providing analog intensity signals in

Apparatus for scanning a document includes an array of light emitting diodes, or optical fibers, arranged across the width of the document and extending further than its edges, a corresponding array of photo-diodes, or fiber optics connected to photo-diodes, for providing analog intensity signals indicative of the degree of transmission of light to each sensor, and an analyzing circuit responsive to each of the intensity signals to determine the condition of the document, and especially to determine the position of the edges of the document, and the size of any pin-holes or tears in the document. According to the invention, the analyzing circuit derives digital signals indicative of the relative intensity value of each analog signal with regard to three or more predetermined threshold values of intensity, each threshold level corresponding to a different degree of obscuration of a sensor by the corresponding area of the document. If a threshold value T3 is exceeded, but a higher threshold value T4 is not exceeded, then the circuit assumes that the corresponding sensor indicates 1/4 obscuration, and that for example the edge of the document lies at a distance from the neighboring sensor equal to 1/4 of the separation between adjacent sensors.

대표청구항 ▼

1. An apparatus for scanning a surface of a sheet like member to determine the position of edges of the member, said apparatus comprising: a sensor array consisting of a plurality of photoelectric sensors arranged transversely across the surface to receive light from a corresponding plurality of

1. An apparatus for scanning a surface of a sheet like member to determine the position of edges of the member, said apparatus comprising: a sensor array consisting of a plurality of photoelectric sensors arranged transversely across the surface to receive light from a corresponding plurality of elemental areas across a transverse strip of the surface, conveyor means for providing relative longitudinal movement of the member with respect to the sensor array, allowing the sensor array to scan the member longitudinally, and a processing circuit for determining the relationships between the signal from each sensor, representing the intensity of received light, and at least three predetermined threshold values of intensity and, in accordance with said relationships, for determining the transverse position of a discontinuity in the amount of light received from the elemental areas across the strip, corresponding to an edge of the member, to a greater resolution than would be possible using only one threshold value of intensity for each sensor. 2. An apparatus in accordance with claim 1, including a source of light for transmitting light through the elemental areas into corresponding ones of the sensors, the light source extending transversely beyond at least one edge of the member thereby to transmit light directly to corresponding sensors. 3. An apparatus in accordance with claim 1, wherein the number of threshold levels is four, so that the transverse position of any discontinuity is detected to the nearest quarter of the distance separating adjacent sensors. 4. An apparatus in accordance with claim 1, including means responsive to the signal obtained from a sensor which is completely obscured by the member, to derive a signal indicative of the optical transmission factor of the region of the surface which is obscuring the sensor. 5. An apparatus in accordance with claim 1, wherein the processing circuit includes means responsive to the said relationships between the signals and the threshold values, to determine the position of at least one of the surface, by locating a group of adjacent sensors showing a transition from substantial obscuration to substantial transmission of light. 6. An apparatus in accordance with claim 5, wherein the processing circuit further includes means responsive to said relationships between the signals and the threshold values, to determine the position of the edge within the boundaries of the partially obscured sensor, by taking account of which threshold values are exceeded by the level of the signal derived from the partially obscured sensor. 7. An apparatus in accordance with claim 5, wherein the processing circuit includes means responsive to the said relationships to determine the position of any one of a pinhole and a tear in the surface, by determining which sensors are surrounded by groups of substantially obscured sensors. 8. An apparatus in accordance with claim 7, wherein the processing circuit determines the size of the pinhole or tear within the boundaries of the partially-obscured sensor which receives light through the pin-hole or tear, by taking account of which threshold values are exceeded by the level of the signal derived from the partially-obscured sensor. 9. An apparatus in accordance with claim 1, wherein the sensors are coupled to corresponding areas of the surface by means of optical fibers. 10. An apparatus in accordance with claim 2, wherein the light source is coupled to the opposite face of said surface by means of an array of optical fibers. 11. An apparatus in accordance with claim 2, wherein light passing between the light source and the sensors is transmitted through the member in substantially parallel beams. 12. An apparatus in accordance with claim 1, wherein said transverse strip is illuminated by an array of light-emitting diodes, and each sensor is a photo-diode arranged to receive light from a corresponding one of the light-emitting diodes. 13. An apparatus in accordance with claim 10, further including converging lenses interposed in the light paths between elements of the light source and their corresponding sensors, for the purpose of forming a substantially parallel beam of light.