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Blocked impurity band detectors 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-031/06
  • H01L-031/18
  • H01L-027/14
출원번호 US-0199881 (1980-10-23)
발명자 / 주소
  • Petroff Michael D. (Fullerton CA) Stapelbroek Maryn G. (Santa Ana CA)
출원인 / 주소
  • Rockwell International Corporation (El Segundo CA 02)
인용정보 피인용 횟수 : 26  인용 특허 : 7

초록

Disclosed is a blocked-impurity-band detector, including an active layer which is doped with a sufficient amount of either a donor or an acceptor impurity that significant charge transport can occur in an impurity band in addition to the charge transport of electrons in the conduction band of the la

대표청구항

A blocked-impurity-band detector, comprising: an active layer doped with a sufficient amount of an impurity that charge transport can occur in an impurity band in addition to the charge transport of electrons in the conduction band of said layer or holes in the valence band of said layer; an impurit

이 특허에 인용된 특허 (7)

  1. Keen John M. (Hanley Swan GB2) Willoughby Arthur F. W. (Eastleigh GB2), Fabrication of infra-red charge coupled devices.
  2. Nelson Richard D. (Santa Ana CA) Hughes A. James (Tustin CA), Image sensor having improved moving target discernment capabilities.
  3. Klein Raphael (Los Altos CA), Ionization resistant MOS structure.
  4. Herbst Heiner (Haar DEX) Pfleiderer Hans-Jrg (Zorneding DEX) Koch Rudolf (Germering-Unterpfaffenhofen DEX) Tihanyi Jen (Munich DEX), Optoelectronic sensor according to the principle of carrier injection.
  5. Dombrowsky Donald S. (Spring Valley NY), Shielded flat cable.
  6. Su Stephen C. (San Clemente CA) Finnila Ronald M. (Carlsbad CA), Signal detection method for IR detector having charge readout structure.
  7. Chikamura Takao (Osaka JPX) Fujiwara Shinji (Minooshi JPX) Terui Yasuaki (Neyagawa JPX) Fukai Masakazu (Nishinomiya JPX), Solid-state image sensor.

이 특허를 인용한 특허 (26)

  1. Overhauser Albert W. (West Lafayette IN) Maserjian Joseph (Goleta CA), Alternating gradient photodetector.
  2. Saylor, Stephen D.; Pralle, Martin U., Biometric imaging devices and associated methods.
  3. Pralle, Martin U.; Carey, James E.; Saylor, Stephen D., Electromagnetic radiation imaging devices and associated methods.
  4. Jiang, Jutao; Borg, Matt, High dynamic range CMOS image sensor having anti-blooming properties and associated methods.
  5. Carey, James E.; Miller, Drake, High speed photosensitive devices and associated methods.
  6. Petroff Michael D. (Fullerton CA), Impurity band conduction detector having photoluminescent layer.
  7. Stapelbroek Maryn G. (Santa Ana CA) Petroff Michael D. (Fullerton CA) Bharat Ramasesha (Orange CA), Intrinsic impurity band conduction detectors.
  8. McIntyre,Thomas J.; Rodgers,John C., Method of forming interlayer connections in integrated optical circuits, and devices formed using same.
  9. Coon Darryl D. (Pittsburgh PA) Devaty Robert P. (Pittsburgh PA) Perera A. G. Unil (Pittsburgh PA) Sherriff Ralph E. (Pittsburgh PA), Method of operating p-i-n diodes and superlattice devices as far infrared detectors.
  10. Kinch, Michael A.; Schaake, Christopher A., Minority carrier based HgCdTe infrared detectors and arrays.
  11. Kinch, Michael A.; Schaake, Christopher A., Minority carrier based HgCdTe infrared detectors and arrays.
  12. Kinch, Michael A.; Schaake, Christopher A., Minority carrier based HgCdTe infrared detectors and arrays.
  13. Blomberg Martti Juhani,FIX ; Torkkeli Altti Kaleva,FIX ; Lehto Ari,FIX, Optically black surface for producing the same.
  14. Haddad, Homayoon; Jiang, Jutao; McKee, Jeffrey; Miller, Drake; Forbes, Leonard; Palsule, Chintamani, Photosensitive imaging devices and associated methods.
  15. Haddad, Homayoon; McKee, Jeffrey; Jiang, Jutao; Miller, Drake; Palsule, Chintamani; Forbes, Leonard, Photosensitive imaging devices and associated methods.
  16. Jiang, Jutao; McKee, Jeffrey; Pralle, Martin U., Photosensitive imaging devices and associated methods.
  17. Jiang, Jutao; McKee, Jeffrey; Pralle, Martin U., Photosensitive imaging devices and associated methods.
  18. Pralle, Martin U.; McKee, Jeffrey; Sickler, Jason, Pixel isolation elements, devices and associated methods.
  19. Pralle, Martin U.; McKee, Jeffrey; Sickler, Jason, Pixel isolation elements, devices and associated methods.
  20. Haddad, Homayoon; McKee, Jeffrey; Jiang, Jutao; Miller, Drake; Palsule, Chintamani; Forbes, Leonard, Process module for increasing the response of backside illuminated photosensitive imagers and associated methods.
  21. Haddad, Homayoon; McKee, Jeffrey; Jiang, Jutao; Miller, Drake; Palsule, Chintamani; Forbes, Leonard, Process module for increasing the response of backside illuminated photosensitive imagers and associated methods.
  22. Martin, Robert J., Remote temperature sensing long wave length modulated focal plane array.
  23. Haddad, Homayoon; Jiang, Jutao, Shallow trench textured regions and associated methods.
  24. Bharat Ramasesha (Orange CA) Petroff Michael D. (Fullerton CA), Short wavelength impurity band conduction detectors.
  25. Tennant,William E.; Gunning, III,William J.; Arias,Jose M., Spectral imager and fabrication method.
  26. Haddad, Homayoon; Feng, Chen; Forbes, Leonard, Three dimensional imaging utilizing stacked imager devices and associated methods.
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