초록 ▼

A system for the analysis of gas samples from a dry and dusty environment, such as the interior of a lime kiln, includes a probe which extends relatively far into the kiln, to avoid the adverse effect on the measurements of extraneous, i.e., “tramp”, air which may leak into the kiln. A sample of the

A system for the analysis of gas samples from a dry and dusty environment, such as the interior of a lime kiln, includes a probe which extends relatively far into the kiln, to avoid the adverse effect on the measurements of extraneous, i.e., “tramp”, air which may leak into the kiln. A sample of the gas is drawn through an isolation tube which extends from the probe chamber in a direction for sample flow opposite to the flow of gases in the kiln. The sample is passed through a filter, within the probe chamber; pumped to a conditioning system, in which the sample gas is cleaned and cooled; and then pumped to gas analysis cells for the analysis of the individual gases. The probe chamber is mounted at the end of a support pipe which carries a first tube, connected to the filter. This pipe serves as a path to introduce purge air for the filter and also calibration gases for test purposes. The actual gas sample is withdrawn through an innermost pipe which terminates just upstream of the inlet of the filter. A third tube, connects directly into the probe chamber, and not through the filter, and through which purge air or span gases may be pumped.

대표청구항 ▼

A gas analyzer system for use in dry and dusty environments, wherein gas samples are withdrawn by the system from within a chamber, the system comprising: a plurality of gas analyzer cells, a plurality of sources of calibration gases and a source of purge air, said cells and sources being located ou

A gas analyzer system for use in dry and dusty environments, wherein gas samples are withdrawn by the system from within a chamber, the system comprising: a plurality of gas analyzer cells, a plurality of sources of calibration gases and a source of purge air, said cells and sources being located outside of the chamber environment; a probe support means including a support pipe extending sufficiently far into the chamber to substantially avoid the effect of tramp air on the measurments, the support pipe having a free end in the chamber; a probe chamber fixed near the free end of the support pipe; an isolation tube means fixed to the probe chamber to bring sample gas into the probe chamber and a filter means within the probe chamber to filter the gas samples; a first pipe means, to selectively pressurize the system, which conducts gas and air from the sources of calibration gas and source of purge air to the probe filter, the first pipe means being laid for a substantial extent of its length within said support pipe; a second pipe means laid for a substantial extent of its length within said support pipe to conduct calibration gases and purge air from the said sources to the probe chamber; and a sample tube means laid for a substantial extent of its length within said support pipe to conduct gas samples from the filter to the gas analyzer cells.