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Method for making a silicon carbide substrate 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C30B-019/00
출원번호 US-0369911 (1982-04-19)
우선권정보 JP-0007834 (1979-01-25); JP-0010199 (1979-01-29); JP-0052198 (1979-04-26); JP-0053934 (1979-04-28); JP-0056120 (1979-05-07); JP-0056134 (1979-05-07); JP-0056129 (1979-05-07); JP-0056118 (1979-05-07); JP-0121
발명자 / 주소
  • Ioku Toshinori (Nara JPX) Sakurai Takeshi (Nara JPX)
출원인 / 주소
  • Sharp Kabushiki Kaisha (Osaka JPX 03)
인용정보 피인용 횟수 : 25  인용 특허 : 3

초록

A silicon carbide seed layer is first formed on a (111) major surface of a silicon substrate through the use of the conventional chemical vapor deposition method. The silicon carbide seed layer includes a first surface confronting the silicon substrate. The first surface shows a predetermined grain

대표청구항

A method for fabricating a silicon carbide substrate comprising the steps of: providing a clean surface silicon base plate; depositing a silicon carbide seed layer on said clean surface silicon base plate, said silicon carbide seed layer including a first surface confronting said clean surface silic

이 특허에 인용된 특허 (3)

  1. Knippenberg Wilhelmus Franciscus (Eindhoven NL) Verspui Gerrit (Eindhoven NL), Filamentary silicon carbide crystals by VLS growth in molten iron.
  2. Garrison Lilburn H. (Vista CA) Dixit Anant D. (Capilla Court IN), Method for providing low cost wafers for use as substrates for integrated circuits.
  3. Gartman William Wesley (Garland TX), Vapor epitaxial method for depositing gallium arsenide phosphide on germanium and silicon substrate wafers.

이 특허를 인용한 특허 (25)

  1. Schlke Karl-Albert (Grosskrotzenburg DEX), Double-walled quartz-glass tube for semiconductor-technology processes.
  2. Loboda, Mark; Parfeniuk, Christopher, Flat SiC semiconductor substrate.
  3. Loboda, Mark; Parfeniuk, Christopher, Flat SiC semiconductor substrate.
  4. Forrest, David Thomas; Schauer, Mark Wallace, Free-standing silicon carbide articles formed by chemical vapor deposition and methods for their manufacture.
  5. Forrest, David Thomas; Schauer, Mark Wallace, Free-standing silicon carbide articles formed by chemical vapor deposition and methods for their manufacture.
  6. Loboda, Mark; Chung, Gilyong, High voltage power semiconductor device on SiC.
  7. Loboda, Mark; Chung, Gilyong, High voltage power semiconductor devices on SiC.
  8. Inaba Takeshi,JPX ; Kitazawa Atsuo,JPX, Jig for semiconductor wafers and method for producing the same.
  9. Andre Leycuras FR, Method for epitaxial growth on a substrate.
  10. Gotou Hiroshi (Niiza JPX), Method for fabricating a silicon carbide substrate.
  11. Loboda, Mark; Drachev, Roman; Hansen, Darren; Sanchez, Edward, Method for growing a SiC crystal by vapor deposition onto a seed crystal provided on a support shelf which permits thermal expansion.
  12. Loboda, Mark, Method for growing a SiC crystal by vapor deposition onto a seed crystal provided on a supporting shelf which permits thermal expansion.
  13. Hoff, Andrew M., Method for making silicon containing dielectric films.
  14. Hansen, Darren; Loboda, Mark; Manning, Ian; Moeggenborg, Kevin; Mueller, Stephan; Parfeniuk, Christopher; Quast, Jeffrey; Torres, Victor; Whiteley, Clinton, Method for manufacturing SiC wafer fit for integration with power device manufacturing technology.
  15. Hansen, Darren; Loboda, Mark; Manning, Ian; Moeggenborg, Kevin; Mueller, Stephan; Parfeniuk, Christopher; Quast, Jeffrey; Torres, Victor; Whiteley, Clinton, Method for manufacturing SiC wafer fit for integration with power device manufacturing technology.
  16. Frisina, Ferruccio; Abbondanza, Giuseppe, Method for manufacturing a silicon carbide wafer using a susceptor having draining openings.
  17. Kaneko, Tadaaki; Asaoka, Yasushi; Sano, Naokatsu, Method for producing single crystal silicon carbide.
  18. Loboda, Mark, Method to reduce dislocations in SiC crystal growth.
  19. Sudarshan, Tangali S.; Song, Haizheng; Rana, Tawhid, Pretreatment method for reduction and/or elimination of basal plane dislocations close to epilayer/substrate interface in growth of SiC epitaxial films.
  20. Sudarshan, Tangali S.; Song, Haizheng; Rana, Tawhid, Pretreatment method for reduction and/or elimination of basal plane dislocations close to epilayer/substrate interface in growth of SiC epitaxial films.
  21. Sudarshan, Tangali S.; Song, Haizheng; Rana, Tawhid, Pretreatment method for reduction and/or elimination of basal plane dislocations close to epilayer/substrate interface in growth of SiC epitaxial films.
  22. Suzuki Akira (Nara JPX) Furukawa Katsuki (Osaka JPX), Process for producing a SiC semiconductor device.
  23. Frisina, Ferruccio; Abbondanza, Giuseppe, Reaction chamber including a susceptor having draining openings for manufacturing a silicon carbide wafer.
  24. Torimi, Satoshi; Nogami, Satoru; Matsumoto, Tsuyoshi, Seed material for liquid phase epitaxial growth of monocrystalline silicon carbide, and method for liquid phase epitaxial growth of monocrystalline silicon.
  25. Loboda, Mark J.; Zhang, Jie, SiC substrate with SiC epitaxial film.
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