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Measurement of electrical signals with subpicosecond resolution

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/00
출원번호 US-0593992 (1984-03-27)
발명자 / 주소
  • Mourou Gerard (Rochester NY) Meyer Kevin E. (Rochester NY)
출원인 / 주소
  • University of Rochester (Rochester NY 02)
인용정보 피인용 횟수 : 28  인용 특허 : 4

초록

Electrical signals are measured (analyzed and displayed) with subpicosecond resolution by electro-optic sampling of the signal in an electro-optic crystal, the index of which changes in response to the electric field produced by the signal, in accordance with the Pockels effect. The crystal is dispo

대표청구항

In the method of measuring an electrical signal with subpicosecond resolution with the aid of a transmission line along which said signal propagates which is disposed on an electro-optic crystal adjacent said line so that an electric field is created which passes through at least a portion of said c

이 특허에 인용된 특허 (4)

  1. Yasumura Gary (Santa Clara CA) Genin Robert D. (San Jose CA) Wetenkamp Scott F. (Los Altos CA), Broad band microwave detector.
  2. Yasuda Tomio (Kasukabe JPX) Ichiyama Toshiyuki (Higashimine JPX), Electric field detector.
  3. Valdmanis Janis A. (Columbus IN) Mourou Gerard (Rochester NY), Measurement of electrical signals with picosecond resolution.
  4. Leonberger Frederick J. (Carlisle MA) Donnelly Joseph P. (Carlisle MA), Planar optical waveguide, modulator, variable coupler and switch.

이 특허를 인용한 특허 (28)

  1. Goutzoulis Anastasios P. (Forest Hills Boro PA), Acousto-optic system for testing high speed circuits.
  2. Nazarathy Moshe (Mountain View CA) Dolfi David W. (Los Altos CA) Kolner Brian H. (Woodside CA), Distributed sampling of electrical and optical signals using coded switched electrode travelling wave modulators.
  3. Forsyth Keith W. (Philadelphia PA) Bado Philippe (Rush NY), Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier.
  4. Williamson Steven (Ann Arbor MI), Electro-optic signal measurement.
  5. Williamson Steven (Ann Arbor MI), Electro-optic signal measurement.
  6. Williamson Steven L. (Henrietta NY), Electro-optic signal measurement.
  7. Wang,Zhiyong; Dias,Rajendra; Goyal,Deepak, Electro-optic time domain reflectometry.
  8. Takahashi Hironori (Shizuoka JPX) Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX), Electro-optic voltage detector having a transparent electrode.
  9. Nakamura Takuya (Shizuoka JPX) Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX), Electro-optical voltage detector.
  10. Knox Wayne H. (Rumson NJ) Miller David A. B. (Fair Haven NJ), Electrooptic apparatus for the measurement of ultrashort electrical signals.
  11. Kawano Youzo (Ebina JPX) Takahashi Tadashi (Atsugi JPX) Shimura Yasuhiko (Hatano JPX) Takahashi Yukihiro (Atsugi JPX), Electrooptic effect element and electrical signal waveform measuring apparatus using the same.
  12. Bloom David M. (Menlo Park CA) Kolner Brian H. (Menlo Park CA), High speed testing of electronic circuits by electro-optic sampling.
  13. Selkner Gerald (Linz DEX), Mechanical probe for optical measurement of electrical signals.
  14. Shinagawa Mitsuru (Zama JPX) Nagatsuma Tadao (Kanagawa JPX), Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits.
  15. Meyrueix Paul (Paris FRX) Tremblay Gerard (Loudin CA FRX) Vernhes Jean P. (San Jose CA), Method and apparatus for electro-optically testing circuits.
  16. Itatani Taro,JPX ; Nakagawa Tadashi,JPX ; Sugiyama Yoshinobu,JPX ; Ohta Kimihiro,JPX, Method of electro-optical measurement for vector components of electric fields and an apparatus thereof.
  17. Sidiropoulos, Stefanos; Liaw, Haw-Jyh, Methods and apparatus for clock and data recovery using transmission lines.
  18. Mukohzaka Naohisa (Shizuoka JPX), Optical associative memory employing an autocorrelation matrix.
  19. Ishikawa Masatoshi (Ibaraki JPX) Mukohzaka Naohisa (Shizouka JPX), Opto-electric hybrid associative memory.
  20. d\Humieres Etienne (Versailles FRX) Bernet Jean M. (La Celle St. Cloud FRX) Eumurian Cregoire (Argenteuil FRX), System for analyzing transients in a non-luminous signal.
  21. Aoshima Shinichiro (Hamamatsu JPX) Tsuchiya Yutaka (Hamamatsu JPX), Voltage detector.
  22. Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX), Voltage detector.
  23. Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX), Voltage detector employing electro-optic material having a corner-cube shape.
  24. Takahashi Hironori (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX) Aoshima Shinichiro (Shizuoka JPX), Voltage detector for detecting a voltage developing in a selected area of an object.
  25. Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX) Takahashi Hironori (Shizuoka JPX), Voltage detector having compensation for polarization change caused by spontaneous birefringence.
  26. Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX) Nakamura Takuya (Shizuoka JPX), Voltage detector using electro-optic material and interference of light beams.
  27. Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX), Voltage detector utilizing an optical probe of electro-optic material.
  28. Takahashi Hironori (Shizuoka JPX) Aoshima Shinichiro (Shizuoka JPX) Tsuchiya Yutaka (Shizuoka JPX), Voltage measuring apparatus.
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