초록 ▼

This invention is directed to a new and improved system for determining optical aberrations, such as for example alignment, focus, tilt, astigmatism or coma of a telescope optical system, wherein the telescope optical system is arranged for imaging a random scene and includes a plurality of subapert

This invention is directed to a new and improved system for determining optical aberrations, such as for example alignment, focus, tilt, astigmatism or coma of a telescope optical system, wherein the telescope optical system is arranged for imaging a random scene and includes a plurality of subapertures, said system comprising a grating disposed at the focal plane of the telescope optical system, an apodizing mask disposed adjacent the grating, said mask having transparent and opaque portions, an array of light detectors, a field lens disposed adjacent the grating for causing the subapertures to be imaged on the array of detectors, apparatus for effecting relative movement between the grating and the other elements, phase detector electronics for receiving the output from the detectors and outputting individual detector signals, and a processor responsive to the detector signals for determining the difference in phase between the individual detector signals and a reference phase, whereby a measure of the aberration at each subaperture is effected.

대표청구항 ▼

A system for determining optical aberrations in a telescope optical system comprising: said telescope optical system being arranged for imaging a scene; grating means disposed at a focal plane of said telescope optical system; an apodizing mask having transparent and opaque portions disposed adjacen

A system for determining optical aberrations in a telescope optical system comprising: said telescope optical system being arranged for imaging a scene; grating means disposed at a focal plane of said telescope optical system; an apodizing mask having transparent and opaque portions disposed adjacent said grating means wherein there is a gradual gradient transition between said transparent and said opaque portions; an array of light detectors, each of said light detectors being positioned to receive the image of a subaperture portion of said telescope optical system; field lens means disposed adjacent said grating for causing said subaperture portions of the telescope optical system to be imaged on said array of light detectors, respectively; means for effecting relative movement between said grating means and said telescope optical system; means responsive to said light detectors for determining the difference in phase between the individual detector signals and a reference phase; whereby a measure of the aberration at each subaperture portion of said telescope optical system is effected.