초록 ▼

The test fixture for automatic testing equipment of the present invention includes a cover pivotally mounted to an electronic test bed, and means mounted to the cover and operative as the cover is closed to provide full surface contact with an electrical circuit device to be tested. In preferred emb

The test fixture for automatic testing equipment of the present invention includes a cover pivotally mounted to an electronic test bed, and means mounted to the cover and operative as the cover is closed to provide full surface contact with an electrical circuit device to be tested. In preferred embodiment, the test fixture includes a spring-loaded lid that is snap-latchable to, and push-button releasable from, a test bed. A lid panel-inset is rotatably mounted to the lid at a preselected acute angle thereto. The angle is selected such that the panel-inset provides full surface contact with an electrical circuit to be tested when the lid engages the electrical device. The panel-inset rotates to maintain full surface contact while the lid is latched to the test bed. The lid panel-inset provides an abutment surface that is always equally distant from the electrical circuit device to be tested which distributes the impact of the lid panel-inset uniformly over the entire surface area of the electrical circuit device to be tested, thereby substantially eliminating device misalignment occasioned by non-uniform forces and torques.

대표청구항 ▼

An automatic test fixture, comprising: a test bed for receiving an electronic circuit device to be tested; a generally planar cover panel defining a first planar surface and having four side portions cooperative to define an opening formed centrally therethrough; means for pivotally mounting said ge

An automatic test fixture, comprising: a test bed for receiving an electronic circuit device to be tested; a generally planar cover panel defining a first planar surface and having four side portions cooperative to define an opening formed centrally therethrough; means for pivotally mounting said generally planar cover panel to said test bed about a first axis defined along confronting ends thereof; a generally planar cover panel-inset defining a second planar surface and dimensioned to be at least partially received in said opening of said cover panel; first means connected to said cover panel and to said cover panel-inset for mounting said cover panel-inset for rotary motion about a second axis different from and generally parallel to said first axis that is defined in said opening of said cover panel; second means cooperative with said first means for angularly limiting the rotary motion of said cover panel-inset between a first preselected rotary position selected such that the normal to said first planar surface defines a preselected non-zero acute angle with the normal to said second planar surface, and a second preselected rotary position selected such that the normals are generally parallel; said second means includes first and second flanges provided on opposite ends of said cover panel-inset that are cooperative with confronting shoulders provided on opposite side portions defining said opening provided in said cover panel to define said first and said second preselected rotary positions.