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Sputter module for modular wafer processing system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-014/34
  • C23C-014/56
출원번호 US-0856750 (1986-04-28)
발명자 / 주소
  • Messer Mark G. (Los Gatos CA) Stark Lawrence R. (San Jose CA)
출원인 / 주소
  • Varian Associates, Inc. (Palo Alto CA 02)
인용정보 피인용 횟수 : 79  인용 특허 : 6

초록

A machine for sputter deposition of a wafer workpiece also sputters on the wafer supporting mechanism. This causes a need for cleaning or replacement of the support mechanism. A sputter machine is provided in which the supporting mechanism can be isolated from the sputtering source, the pumps and ot

대표청구항

A sputter deposition module comprising: a first vacuum chamber and a second chamber having an opening therebetween; a heater located in said second chamber; a sputter source located in said second chamber opposite said heater; a first arm member in said first vacuum chamber for receiving a substrate

이 특허에 인용된 특허 (6)

  1. Richards Edmond A. (Marlton NJ), Apparatus for conveying a semiconductor wafer.
  2. Tateishi Hideki (Yokohama JPX) Kamei Tsuneaki (Kanagawa JPX) Abe Katsuo (Yokosuka JPX) Kobayashi Shigeru (Kawasaki JPX) Aiuchi Susumu (Yokohama JPX) Nakatsukasa Masashi (Tama JPX) Takahashi Nobuyuki , Apparatus for performing continuous treatment in vacuum.
  3. Boys Donald R. (Cupertino CA) Graves Walter E. (San Jose CA), Disk or wafer handling and coating system.
  4. Graves ; Jr. Walter E. (San Jose CA) Boys Donald (Cupertino CA) Turner Frederick T. (Sunnyvale CA), Sputter-coating system, and vaccuum valve, transport, and sputter source array arrangements therefor.
  5. Nakatsukasa, Masashi; Takahashi, Nobuyuki, Sputtering apparatus comprising control means for preventing impurity gases from entering a sputtering chamber.
  6. Hutchinson, Martin A.; Shaw, R. Howard; Coad, George, Transfer plate rotation system.

이 특허를 인용한 특허 (79)

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  3. Chen,Linlin; Wilson,Gregory J.; McHugh,Paul R.; Weaver,Robert A.; Ritzdorf,Thomas L., Apparatus and method for electrochemically depositing metal on a semiconductor workpiece.
  4. Yokomizo,Kenji, Apparatus and method of securing a workpiece during high-pressure processing.
  5. Hanson,Kyle M., Apparatus and methods for electrochemical processing of microelectronic workpieces.
  6. Hanson,Kyle M.; Ritzdorf,Thomas L.; Wilson,Gregory J.; McHugh,Paul R., Apparatus and methods for electrochemical processing of microelectronic workpieces.
  7. Hanson,Kyle M.; Ritzdorf,Thomas L.; Wilson,Gregory J.; McHugh,Paul R., Apparatus and methods for electrochemical processing of microelectronic workpieces.
  8. Harris,Randy; Woodruff,Daniel J., Apparatus for manually and automatically processing microelectronic workpieces.
  9. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of a workpiece.
  10. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of multiple workpieces.
  11. Kyung Hyun-Su,KRX ; Choi Won-Song,KRX ; Shin Jung-Ho,KRX, Apparatus for thermal treatment of thin film wafer.
  12. Zejda Jaroslav (Rodenbach DEX) Schuhmacher Manfred (Alzenau-Michelbach DEX), Cathode sputtering system.
  13. Hanson, Kyle M.; Klocke, John L., Chambers, systems, and methods for electrochemically processing microfeature workpieces.
  14. Klocke,John; Hanson,Kyle M, Chambers, systems, and methods for electrochemically processing microfeature workpieces.
  15. Klocke,John; Hanson,Kyle M, Chambers, systems, and methods for electrochemically processing microfeature workpieces.
  16. Crabb Richard (Mesa AZ) Robinson McDonald (Paradise Valley AZ) Hawkins Mark R. (Mesa AZ) Goodwin Dennis L. (Tempe AZ) Ferro Armand P. (Scottsdale AZ) Ozias Albert E. (Aumsville OR) deBoer Wiebe B. (E, Chemical vapor deposition system.
  17. Matt, Thomas, Coating installation for disk-form workpieces.
  18. Jones,William Dale, Control of fluid flow in the processing of an object with a fluid.
  19. Woodruff,Daniel J.; Hanson,Kyle M., Electroplating apparatus with segmented anode array.
  20. Woodruff,Daniel J.; Hanson,Kyle M., Electroplating apparatus with segmented anode array.
  21. Woodruff, Daniel J.; Erickson, James J., End-effectors and transfer devices for handling microelectronic workpieces.
  22. Woodruff,Daniel J.; Harris,Randy A.; Erickson,James J.; Carr,Douglas W., End-effectors for handling microelectronic wafers.
  23. Woodruff,Daniel J.; Oberlitner,Thomas H.; Harris,Randy A.; Erickson,James J.; Carr,Douglas W., End-effectors for handling microelectronic workpieces.
  24. Sheydayi,Alexei; Sutton,Thomas, Gate valve for plus-atmospheric pressure semiconductor process vessels.
  25. Jones, William D., High pressure fourier transform infrared cell.
  26. Biberger, Maximilian A.; Layman, Frederick Paul; Sutton, Thomas Robert, High pressure processing chamber for semiconductor substrate.
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  28. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  29. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  30. Ken Lee ; Ke Ling Lee ; Mingwei Jiang ; Robert M. Martinson, Horizontal sputtering system.
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  32. Woodruff, Daniel J.; Harris, Randy, Integrated tools with transfer devices for handling microelectronic workpieces.
  33. Sheydayi,Alexei, Method and apparatus for clamping a substrate in a high pressure processing system.
  34. Goshi,Gentaro, Method and apparatus for cooling motor bearings of a high pressure pump.
  35. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method and apparatus for supercritical processing of multiple workpieces.
  36. Parent,Wayne M.; Goshi,Gentaro, Method and system for cooling a pump.
  37. Parent,Wayne M., Method and system for determining flow conditions in a high pressure processing system.
  38. Parent, Wayne M.; Geshell, Dan R., Method and system for passivating a processing chamber.
  39. Hansen,Brandon; Lowe,Marie, Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid.
  40. Kawamura,Kohei; Asano,Akira; Miyatani,Koutarou; Hillman,Joseph T.; Palmer,Bentley, Method for supercritical carbon dioxide processing of fluoro-carbon films.
  41. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method for supercritical processing of multiple workpieces.
  42. Biberger,Maximilian A.; Schilling,Paul E., Method of depositing metal film and metal deposition cluster tool including supercritical drying/cleaning module.
  43. Biberger,Maximilian Albert; Layman,Frederick Paul; Sutton,Thomas Robert, Method of supercritical processing of a workpiece.
  44. Woodruff, Daniel J.; Harris, Randy, Microelectronic workpiece transfer devices and methods of using such devices in the processing of microelectronic workpieces.
  45. Lauro Michael P. (Lincoln RI) Beaulieu Roland (Tiverton RI) Crissman Everett E. (Woonsocket RI) Loferski Joseph J. (Providence RI) Case Christopher (New Providence NJ), Modular sputtering apparatus.
  46. Sheydayi,Alexei, Non-contact shuttle valve for flow diversion in high pressure systems.
  47. Sheydayi,Alexei, Pressure energized pressure vessel opening and closing device and method of providing therefor.
  48. Wuester,Christopher D., Process flow thermocouple.
  49. Davis Cecil J. (Greenville TX) Abernathy Joseph V. (Wylie TX) Matthews Robert T. (Plano TX) Hildenbrand Randall C. (Richardson TX) Simpson Bruce (Dallas TX) Bohlman James G. (Forney TX) Loewenstein L, Processing apparatus.
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  51. Maher Joseph A. (South Hamilton MA) Vowles E. John (Goffstown NH) Napoli Joseph D. (Winham NH) Zafiropoulo Arthur W. (Manchester MA) Miller Mark W. (Burlington MA), Quad processor.
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  73. Wilson,Gregory J.; McHugh,Paul R.; Weaver,Robert A.; Ritzdorf,Thomas L., Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece.
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