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Optical proximity imaging method and apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/14
출원번호 US-0834532 (1986-02-28)
발명자 / 주소
  • Guerra John M. (Concord MA) Plummer William T. (Concord MA)
출원인 / 주소
  • Polaroid Corporation (Cambridge MA 02)
인용정보 피인용 횟수 : 56  인용 특허 : 7

초록

An optical proximity imaging method and apparatus in which the proximity of glass surface to another surface is determined by frustration of total internal reflection of light energy from the glass surface to develop a light area pattern, calibrating gray scale densities of the pattern so that level

대표청구항

Apparatus for displaying variations in proximity between a given surface of a transmissive body and another surface, said apparatus comprising: an optically transmissive body having a reflecting surface and a pair of angularly disposed planar surfaces between which said reflecting surface is located

이 특허에 인용된 특허 (7)

  1. Nissl ; Norbert, Accelerometer.
  2. Gordon ; II Joseph G. (San Jose CA) Sincerbox Glenn T. (San Jose CA), Amplitude modulation of light beam.
  3. Altman Daniel E. (San Diego CA), Frustrated total internal reflection fiber-optic small-motion sensor for hydrophone use.
  4. McNeill, William H.; Chen, Yung J., High frequency light modulation device.
  5. Popenoe Charles H. (6307 Wiscasset Road Bethesda MD), Light reflective opti-mechanical displacement microindicator.
  6. Fromm Ingrid (Munich DEX), Optical device for measuring slight differences of pressure by means of a change in light intensity.
  7. Nassimbene Ernie George (Los Gatos CA), Palm print identification.

이 특허를 인용한 특허 (56)

  1. Hoult, Robert Alan; Carter, Ralph Lance; Wilkinson, Antonio Canas; Styles, Paul, Accessory for attenuated total internal reflectance (ATR) spectroscopy.
  2. Hoult, Robert Alan; Carter, Ralph Lance; Wilkinson, Antonio Canas; Styles, Paul, Accessory for attenuated total internal reflectance (ATR) spectroscopy.
  3. Hoult, Robert Alan; Carter, Ralph Lance; Wilkinson, Antonio Canas; Styles, Paul, Accessory for attenuated total internal reflectance (ATR) spectroscopy.
  4. Hoult, Robert Alan; Carter, Ralph Lance; Wilkinson, Antonio Canas; Styles, Paul, Accessory for attenuated total internal reflective (ATR) spectroscopy.
  5. Kley, Victor B., Active cantilever for nanomachining and metrology.
  6. Kley, Victor B., Active cantilever for nanomachining and metrology.
  7. Kley,Victor B., Active cantilever for nanomachining and metrology.
  8. Kley,Victor B., Active cantilever for nanomachining and metrology.
  9. Guerra John M., Apparatus and methods for providing phase controlled evanescent illumination.
  10. Hill, Henry A., Control of position and orientation of sub-wavelength aperture array in near-field microscopy.
  11. Guerra John M., Dark field, photon tunneling imaging systems and methods for measuring flying height of read/write heads.
  12. Guerra John M., Dark field, photon tunneling imaging systems and methods for optical recording and retrieval.
  13. Hill, Henry A., Differential interferometric scanning near-field confocal microscopy.
  14. Kley, Victor B., Fluid delivery for scanning probe microscopy.
  15. Kley,Victor B., Fluid delivery for scanning probe microscopy.
  16. Burka E. Michael ; Curbelo Raul, Imaging ATR spectrometer.
  17. Kley, Victor B., Low-friction moving interfaces in micromachines and nanomachines.
  18. Kley, Victor B., Manufacturing of micro-objects such as miniature diamond tool tips.
  19. Kley, Victor B., Method and apparatus for micromachines, microstructures, nanomachines and nanostructures.
  20. Kley, Victor B., Method and apparatus for micromachines, microstructures, nanomachines and nanostructures.
  21. Kley,Victor B., Method and apparatus for micromachines, microstructures, nanomachines and nanostructures.
  22. Kley, Victor B., Method and apparatus for scanning in scanning probe microscopy and presenting results.
  23. Kley,Victor B., Method and apparatus for scanning in scanning probe microscopy and presenting results.
  24. Kley, Victor B.; LoBianco, Robert T., Method and apparatus for tool and tip design for nanomachining and measurement.
  25. Hecker, Andreas; Ulrich, Heinrich; Knebel, Werner; Moellmann, Kyra, Method for analyzing a sample and microscope for evanescently illuminating the sample.
  26. Hill, Henry A., Multiple-source arrays with optical transmission enhanced by resonant cavities.
  27. Kley,Victor B., Nanomachining method and apparatus.
  28. Kley, Victor B., Nanometer scale data storage device and associated positioning system.
  29. Kley,Victor B., Nanometer scale data storage device and associated positioning system.
  30. Hirae Sadao (Kyoto JPX) Matsubara Hideaki (Kyoto JPX) Kouno Motohiro (Kyoto JPX) Sakai Takamasa (Kyoto JPX), Non-destructive measuring sensor for semiconductor wafer and method of manufacturing the same.
  31. Kley,Victor B., Object inspection and/or modification system and method.
  32. Rich, Christopher Chapman; Petersen, Joel Mikael; Tamkin, John Michael; Phillips, Roger Winston; Harvey, Phillip Christopher, Optical products, masters for fabricating optical products, and methods for manufacturing masters and optical products.
  33. Hill, Henry Allen, Optical storage system based on scanning interferometric near-field confocal microscopy.
  34. Hill, Henry Allen, Optical storage system based on scanning interferometric near-field confocal microscopy.
  35. Batchelder David N. (London GB3) Willson Jolyon P. (Duxford GB3), Optical surface plasmon sensor device.
  36. Montagu,Jean I., Optically active substrates.
  37. Roessler,Kenneth; Chen,Dong, Scan data collection for better overall data accuracy.
  38. Roessler, Kenneth; Chen, Dong, Scan data collection for better overall data accurancy.
  39. Henry Allen Hill, Scanning interferometric near-field confocal microscopy.
  40. Hill, Henry A., Scanning interferometric near-field confocal microscopy with background amplitude reduction and compensation.
  41. Kley,Victor B., Scanning probe microscope assembly.
  42. Kley,Victor B., Scanning probe microscope assembly.
  43. Kley Vic B., Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Field, and Scanning probe measurements and associated images.
  44. Kley Vic B., Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.
  45. Kley, Vic B., Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.
  46. Vic B. Kley, Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.
  47. Vic B. Kley, Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images.
  48. Kley Victor B., Scanning probe microscope assembly and method for making spectrophotometric near-field optical and scanning measurements.
  49. Kley, Victor B., Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements.
  50. Victor B. Kley, Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements.
  51. Kley,Victor B., Scanning probe microscopy inspection and modification system.
  52. Kley,Victor B., Scanning probe microscopy inspection and modification system.
  53. Ghislain Lucien P. ; Elings Virgil B., Scanning probe optical microscope using a solid immersion lens.
  54. Kley, Victor B., Sharpness testing of micro-objects such as miniature diamond tool tips.
  55. Guerra John M., Stereoscopic photon tunneling microscope.
  56. Hoult, Robert Alan; Carter, Ralph Lance; Canas Wilkinson, Antonio; Styles, Paul, Systems and methods for attenuated total internal reflectance (ATR) spectroscopy.
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