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Apparatus for use in testing circuit boards 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/28
  • H05K-007/14
출원번호 US-0669117 (1984-11-07)
발명자 / 주소
  • Cutright Robert A. (Holland MI) Briggs Mark W. (Holland MI) Bouwman George J. (Hamilton MI)
출원인 / 주소
  • Wehr Corporation (Milwaukee WI 02)
인용정보 피인용 횟수 : 69  인용 특허 : 6

초록

An apparatus for testing circuit boards, the apparatus comprising a plurality of hand manipulable baskets adapted to contain a plurality of generally planar circuit boards. Each of the baskets includes a plurality of first electrical connectors adapted to engage electrical connectors on the circuit

대표청구항

An apparatus for testing circuit boards, said apparatus comprising a plurality of hand manipulable circuit board baskets adapted to contain a plurality of generally planar circuit boards, each of said baskets including frame means defining a structure of generally open construction, said frame means

이 특허에 인용된 특허 (6)

  1. Bonhomme Francois R. (6 ; Parc de Bearn 92210 Saint Cloud FRX), Cabinets for electrical or electronic equipment.
  2. Anderson Jared A. (Woodside CA) Van Gelder Robert V. (Berkeley CA) Yazolino Lauren F. (Oakland CA) Braun Jimmy E. (Orange CA), Circuit board mounting and cooling assembly.
  3. Veburg John C. (Columbus NE), Electrical resistor testing chamber.
  4. Santomango, Anthony; Hatheway, Jr., Nicholas N., Electronic burn-in system.
  5. Cronin Michael J. (Sherman Oaks CA) Elliot David K. (Burbank CA), Electronic enclosure and articulated back panel for use therein.
  6. Dice Charles A. (Milpitas CA), Modular dynamic burn-in apparatus.

이 특허를 인용한 특허 (69)

  1. Eliashberg Victor M. ; Prakash Kombupalayam M., Apparatus for testing an integrated circuit in an oven during burn-in.
  2. Eliashberg Victor M. ; Prakash Kombupalayam M., Apparatus for testing an integrated circuit in an oven during burn-in.
  3. Eliashberg Victor M. ; Prakash Kombupalayam M., Apparatus for testing an integrated circuit in an oven during burn-in.
  4. Victor M. Eliashberg ; Kombupalayam M. Prakash, Apparatus for testing an integrated circuit in an oven during burn-in.
  5. Gussman Robert L. (Houston TX), Automated burn-in system.
  6. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  7. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  8. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  9. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  10. Daly, Paul J., Connector for enteral fluid delivery set.
  11. Martino, Peter, Damping vibrations within storage device testing systems.
  12. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
  13. Martter, Robert H.; Sundberg, Craig C.; Giardina, Richard N.; Fetscher, Brian S.; Deutschlander, G. James, Device for testing electronic devices.
  14. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  15. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  16. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  17. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
  18. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
  19. Merrow, Brian S., Enclosed operating area for storage device testing systems.
  20. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
  21. Daly, Paul J., Enteral feeding set.
  22. Daly, Paul J., Enteral feeding set.
  23. Szasz Norbert I. (Fremont CA) Shaw Russell G. (Contoocook NH), Environmental stress screening apparatus for electronic products.
  24. Cochran John ; Perry Roger L., Environmental test apparatus with ambient-positioned card support platform.
  25. Cochran John ; Perry Roger L., Environmental test apparatus with partition-isolated thermal chamber.
  26. Magnuson Vernon P. (Canoga Park CA), Environmentally controlled media defect detection system for Winchester disk drives.
  27. Allgeyer,Joseph Peter, Ergonomic, rotatable electronic component testing apparatus.
  28. Lou, Choon Leong; Wang, Li Min; Lau, Yi Ming; Chen, Ho Yeh, Heating apparatus for semiconductor devices.
  29. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
  30. Casa Gene E. (Ruby NY) Gernon Joseph W. (Kingston NY), High density circuit assembly.
  31. Liken,Peter A.; Immink,Darin E., Independently-adjustable circuit board carrier.
  32. Siddiqui, Shakeel M.; Tymofyeyev, Vadim, Method and apparatus to provide a burn-in board with increased monitoring capacity.
  33. Siddiqui,Shakeel M.; Tymofyeyev,Vadim, Method and apparatus to provide a burn-in board with increased monitoring capacity.
  34. Martter, Robert H.; Sundberg, Craig C.; Giardina, Richard N.; Fetscher, Brian S.; Deutschlander, G. James, Method and device for testing electronic devices.
  35. Yong Jaimsomporn TH; Tanawat Boutngam TH; Narupon Tabtimted TH, Method and system for adapting burn-in boards to multiple burn-in systems.
  36. Miller Vernon R. (Atlanta GA) Roberts Lincoln E. (Decatur GA), Microelectronic burn-in system.
  37. John Cochran ; Roger L. Perry, Product carrier for environmental test system.
  38. Srikumar, Kesavan; Chung, John, Rack system and a method for processing manufactured products.
  39. Eric D. Berchtold, Refrigeration system with a scroll compressor.
  40. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  41. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  42. Merrow, Brian S., Storage device testing system cooling.
  43. Merrow, Brian S., Storage device testing system cooling.
  44. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
  45. Robbins,Shane R.; Roundy,Clark M.; Lowry,Jason, Sub rack based vertical housing for computer systems.
  46. Paek Woon-Juk,KRX ; Kang Jeong-Min,KRX ; Ryoo Dae-Geun,KRX ; Sung Young-Bok,KRX ; Nam Chang-Woo,KRX, System for testing hard disk drives.
  47. Wilson Randall R. (Santa Ana CA) Dietz James E. (Yorba Linda CA), System for testing individually a plurality of disk drive units.
  48. Ergun, Mustafa A.; Lindblad, Shaun C.; Tischer, William D., Tablet and monitor support systems.
  49. Ergun, Mustafa A.; Lindblad, Shaun Christopher; Tischer, William Dale, Tablet and monitor support systems.
  50. Funk, Joe; Lindblad, Shaun C.; Ergun, Mustafa A., Tablet mounting arm systems and methods.
  51. Funk, Joe; Lindblad, Shaun C., Tablet mounting systems, stands, and methods.
  52. Ergun, Mustafa A.; Lindblad, Shaun C.; Funk, Joe; Tischer, William D.; Segar, Peter; Prince, David J., Tablet storage and transportation device.
  53. Ergun, Mustafa A.; Lindblad, Shaun C.; Funk, Joseph; Tischer, William D.; Segar, Peter; Prince, David J., Tablet storage and transportation device.
  54. Lindblad, Shaun C.; Funk, Joe; Tischer, William D.; Purrington, Matthew D.; Segar, Peter; Richardson, Diane L.; Prince, David J., Tablet storage device.
  55. Lindblad, Shaun C.; Funk, Joe; Tischer, William Dale; Purrington, Matthew D.; Segar, Peter; Richardson, Diane; Prince, David J., Tablet storage device.
  56. Merrow, Brian S., Temperature control within disk drive testing systems.
  57. Merrow, Brian S., Temperature control within disk drive testing systems.
  58. Merrow, Brian S., Temperature control within storage device testing systems.
  59. Makita, Daisuke; Fukuda, Mitsuru; Sakamaki, Daisuke, Test apparatus.
  60. Makita, Daisuke; Fukuda, Mitsuru; Honobe, Toru, Test head, test board and test apparatus.
  61. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  62. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  63. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
  64. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  65. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  66. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  67. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  68. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  69. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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