초록 ▼

A conductivity-type sensor, typically for use in a wafer sorting system, for detecting the conductivity-type of semiconductor wafers. In measuring conductivity, a two-contact probe is applied to the semiconductor wafer and any static charge which may have been accumulated on the wafer is initially d

A conductivity-type sensor, typically for use in a wafer sorting system, for detecting the conductivity-type of semiconductor wafers. In measuring conductivity, a two-contact probe is applied to the semiconductor wafer and any static charge which may have been accumulated on the wafer is initially discharged at an accelerated rate. The charge state is measured and an acceptable level of discharge requires repeated indications of discharge below a predetermined level. Discharging and charge measurement is repeated a predetermined number of times as necessary to accomplish discharging or the wafer identified as defective. The conductivity-type of the discharged wafer is read from the rectified polarity of an oscillating signal applied to the contacts. A valid indication of conductivity-type requires two consecutive readings of the same conductivity-type. The consecutive readings can be either the first reading of a new wafer identical with the reading of a previous wafer or two consecutive identical readings on the same wafer. Each reading, to be considered an acceptable reading of conductivity-type requires five consecutive, identical conductivity measurements over a predetermined time interval. Failure of such criteria produces a wafer defect indication.

대표청구항 ▼

A testing system for a semiconductor wafer having a conductivity-type to be determined and an undesirable surface static charge to be discharged, comprising: means for electrically and mechanically contacting said wafer; sensing means coupled to said contacting means for providing a first signal ind

A testing system for a semiconductor wafer having a conductivity-type to be determined and an undesirable surface static charge to be discharged, comprising: means for electrically and mechanically contacting said wafer; sensing means coupled to said contacting means for providing a first signal indicating the polarity of the static charge on said semiconductor wafer; accelerated discharge means coupled to said contacting means and responsive to said first signal for applying a second signal having a polarity that is opposite to the polarity of said static charge to said semiconductor wafer for discharging the static charge thereon through said contacting means; and detecting means coupled to said contacting means and operative only after said second signal has been applied to said wafer for determining the conductivity-type thereof.