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Uneven-surface data detection apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/74
출원번호 US-0833276 (1986-02-27)
우선권정보 JP-0041437 (1985-03-03); JP-0059801 (1985-03-25); JP-0181066 (1985-08-20); JP-0212571 (1985-09-27); JP-0212568 (1985-09-27); JP-0212565 (1985-09-27); JP-0282319 (1985-12-16); JP-0004852 (1986-01-13); JP-0004
발명자 / 주소
  • Eguchi Shin (Atsugi JPX) Igaki Seigo (Inagi JPX) Yahagi Hironori (Yokohama JPX) Yamagishi Fumio (Ebina JPX) Ikeda Hiroyuki (Yokohama JPX) Inagaki Takefumi (Kawasaki JPX)
출원인 / 주소
  • Fujitsu Limited (Kawasaki JPX 03)
인용정보 피인용 횟수 : 71  인용 특허 : 0

초록

An uneven-surface data detection apparatus, includes a transparent plate having an uneven-surface contact portion against which an uneven surface to be detected is pressed. A light source illuminates the uneven-surface contact portion through the transparent plate. An uneven-surface image drawing ou

대표청구항

An uneven-surface data detection apparatus for detecting an uneven-surface having projection portions and recess portions, comprising: a transparent plate having upper and lower surfaces and having an uneven-surface contact portion against which an uneven-surface to be detected is pressed; a light s

이 특허를 인용한 특허 (71)

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