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Mixing valve air source 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05D-023/19
  • G05D-023/13
  • F25B-029/00
출원번호 US-0849532 (1986-04-08)
발명자 / 주소
  • Eager George (Cambridge MA) Schey Thomas J. (Woonsocket RI) Selverstone Peter (Cambridge MA)
출원인 / 주소
  • Temptronic Corporation (Newton MA 02)
인용정보 피인용 횟수 : 74  인용 특허 : 17

초록

An improved system for and method of precisely controlling the temperature at a predetermined location at a preselected temperature selected from a range of temperatures is described. The preferred system for carrying out the preferred method includes a mixing valve for separating a fluid stream int

대표청구항

A method of precisely controlling the temperature at a predetermined location at a preselected temperature selected from a range of temperatures, said method comprising the steps of: generating a pressurized stream of fluid; separating said stream into first and second component streams; heating sai

이 특허에 인용된 특허 (17)

  1. Rickard Jimmy R. (Louisville KY), Automatic dryer control.
  2. Funk, Gary L., Control of heat transfer from heat exchangers in parallel.
  3. Gerry Otto F. (Louisville KY), Control system for an automatic clothes dryer.
  4. Palfrey ; Lesley Francis ; Fellows ; Ronald John, Control system for drier.
  5. Kountz ; Kenneth John, Control system for refrigeration apparatus.
  6. Zimmer Hildebrand (Ahrensbrug DT), Cryomedical device.
  7. Davis Laurance B. (3417 E. Turquoise Phoenix AZ 85028), Dental pulp tester.
  8. Tamler Richard (2686 Sacramento St. San Francisco CA 94115) Stoneham Edward B. (3574 Aaron Dr. Santa Rosa CA 95404), Dental pulp vitality tester.
  9. Nuwayser Elie S. (Wellesley MA), Dental-caries detector.
  10. Horiuchi Akinori (Tokyo JPX) Binnaka Toshio (Kawasaki JPX) Maruyama Shigeyuki (Yokohama JPX), Device for testing semiconductor devices at a high temperature.
  11. Demand Erhart E. (Boston MA), Electrical testing system including plastic window test chamber and method of using same.
  12. Muench Ernest (2681 Bloor St. W-4 Toronto ; Ontario CAX M8X 1A4), Low temperature fail-safe cascade cooling apparatus.
  13. Cazzaniga Luigi (Milan ITX), Method and apparatus for indirect measurement of thermal energy.
  14. Stark Marvin M. (Los Altos Hills CA) Rosenfeld Jack B. (San Francisco CA) Pelzner Roger B. (San Mateo CA) Soelberg Kenneth B. (Menlo Park CA), Method and apparatus for measuring the sensitivity of teeth.
  15. Meeker Robert G. (Wappingers Falls NY) Scanlon William J. (Hopewell Junction NY) Segal Zvi (Wappingers Falls NY), Test fixture for use in a high speed electronic semiconductor chip test system.
  16. Major Emery (1210 Brickyard Cove Rd. Point Richmond CA 94801), Thermoelectric diagnostic instrument.
  17. Davis Eugene B. (Newberg OR), Warm water dental syringe.

이 특허를 인용한 특허 (74)

  1. Turner, Jonathan E., Active power monitoring using externally located current sensors.
  2. Uchida Hiroyasu (Katsuta JPX) Abe Tetsuaki (Katsuta JPX) Ishizawa Hiroaki (Katsuta JPX), Apparatus for maintaining liquid temperature at a constant level.
  3. Di Stefano, Thomas H., Apparatus to control device temperature utilizing multiple thermal paths.
  4. Di Stefano, Thomas H., Apparatus to control device temperature utilizing multiple thermal paths.
  5. Malinoski, Mark F.; Jones, Thomas P.; Annis, Brian; Turner, Jonathan E., Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices.
  6. Mark F. Malinoski ; Thomas P. Jones ; Brian Annis ; Jonathan E. Turner, Apparatus, method and system of liquid-based, wide range, fast response temperature control of electronic device.
  7. Linna,Jan Roger; Baron,John; Pellizzari,Roberto O.; Loftus,Peter; Palmer,Peter; Mello,John Paul; Sprague,Stuart Bennett, Capillary fuel injector with metering valve for an internal combustion engine.
  8. Pellizzari, Roberto O.; Baron, John; Linna, Jan Roger; Loftus, Peter; Palmer, Peter; Mello, John Paul; Sprague, Stuart Bennett, Capillary fuel injector with metering valve for an internal combustion engine.
  9. Peterson Clinton A., Cascade refrigeration system.
  10. Peterson, Clinton A., Cascade refrigeration system.
  11. Dunklee, John, Chuck for holding a device under test.
  12. Dunklee, John, Chuck for holding a device under test.
  13. Dunklee, John, Chuck for holding a device under test.
  14. Dunklee,John, Chuck for holding a device under test.
  15. Dunklee,John, Chuck for holding a device under test.
  16. Dunklee,John, Chuck for holding a device under test.
  17. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  18. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  19. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  20. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  21. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  22. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  23. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
  24. Jensen, Olav, Heat exchanger unit having connectors with identical base elements.
  25. Thayer,John Gilbert; Ernst,Donald M., Heat pipe evaporator with porous valve.
  26. Thayer,John Gilbert; Ernst,Donald M., Heat pipe evaporator with porous valve.
  27. Thayer,John Gilbert; Ernst,Donald M., Heat pipe with chilled liquid condenser system for burn-in testing.
  28. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  29. McFadden,Bruce, Localizing a temperature of a device for testing.
  30. Di Stefano, Thomas H., Method and apparatus for controlling temperature.
  31. Jean Luc Pelissier ; Thomas P. Jones ; Jonathan E. Turner ; Mark F. Malinoski, Method and apparatus for temperature control of a device during testing.
  32. Pelissier, Jean Luc, Method and apparatus for temperature control of a device during testing.
  33. Arnquist David C. ; Barnes ; III Grady ; Button Richard D. ; Dunn Chadwick M. ; East ; Jr. Richard C. ; Fritchie Patrick P. ; Galitz Charles M. ; Gardner Gregory E. ; Grandone Cass J. ; Gray Robert C, Method for determination of item of interest in a sample.
  34. Arnquist David C. ; Barnes ; III Grady ; Dunn Chadwick M. ; East ; Jr. Richard C. ; Fritchie Patrick P. ; Gardner Gregory E. ; Grandone Cass J. ; Gray Robert C. ; Holen James T. ; McCoy Jimmy D. ; Mi, Method of performing a process for determining an item of interest in a sample.
  35. Elia,Mimmo; Linna,Jan Roger; Mello,John Paul, Multiple capillary fuel injector for an internal combustion engine.
  36. Elia,Mimmo; Linna,Jan Roger; Mello,John Paul, Multiple capillary fuel injector for an internal combustion engine.
  37. Harris,Daniel L.; McCann,Peter R., Optical testing device.
  38. Nordgren, Greg; Dunklee, John, Probe station.
  39. Nordgren, Greg; Dunklee, John, Probe station.
  40. Schwindt Randy (Portland OR), Probe station having conductive coating added to thermal chuck insulator.
  41. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  42. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  43. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  44. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  45. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  46. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  47. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  48. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  49. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  50. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  51. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  52. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  53. Lesher, Timothy E., Probe testing structure.
  54. Lesher,Timothy E., Probe testing structure.
  55. Lutz, Robert C.; Dickson, Lloyd B.; Eddington, Ralph James, Semiconductor wafer electrical testing with a mobile chiller plate for rapid and precise test temperature control.
  56. Jensen, Olav, Service water heating unit having heat exchangers and circulation pumps.
  57. Arnquist, David C.; Barnes, III, Grady; Button, Richard D.; Dunn, Chadwick M.; East, Jr., Richard C.; Fritchie, Patrick P.; Galitz, Charles M.; Gardner, Gregory E.; Grandone, Cass J.; Gray, Robert C., Structure for determination of item of interest in a sample.
  58. Dunklee,John, Switched suspended conductor and connection.
  59. Dunklee,John, Switched suspended conductor and connection.
  60. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  61. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  62. Andrews, Peter; Hess, David, System for testing semiconductors.
  63. Sloan, Ben J.; Reed, William G., Temperature control apparatus and method with recirculated coolant.
  64. Sloan Ben J. ; Reed William G., Temperature control apparatus with recirculated coolant.
  65. Jones, Thomas P.; Turner, Jonathan E.; Malinoski, Mark F., Temperature control of electronic devices using power following feedback.
  66. Thomas P. Jones ; Jonathan E. Turner ; Mark F. Malinoski, Temperature control of electronic devices using power following feedback.
  67. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  68. Rumbaugh,Scott, Thermal optical chuck.
  69. Rumbaugh,Scott, Thermal optical chuck.
  70. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  71. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  72. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  73. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  74. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
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