초록 ▼

An analytical instrument includes an optical system having a source of incoming radiation (11) which in a transmission test is focused by a primary focusing element (15) onto a sample (16). The radiation transmitted through the sample is collimate by a focusing-collimating element (20) and directed

An analytical instrument includes an optical system having a source of incoming radiation (11) which in a transmission test is focused by a primary focusing element (15) onto a sample (16). The radiation transmitted through the sample is collimate by a focusing-collimating element (20) and directed across the beam of incoming radiation (14) before focused on a detector (12). To perform a test of the reflectance of the sample, an intercept element (28) is moved into position in the incoming beam (14) to deflect a portion (36) of the beam which is directed to the focusing-collimating element (20) and focused on the sample. The reflected radiation from the sample is collected by the focusing-collimating element (20) into a collimated beam (38) that is parallel and adjacent to the incoming beam, and which is directed in a path which passes by the intercept element (28) to be focused onto the detector (12). By selectively moving the intercept element (28) into and out of the path of the beam (14 ), a sample may be analyzed for both transmission and reflectance characteristics without moving the sample.

대표청구항 ▼

In an analytical instrument designed for testing the transmission and reflection of a sample, the instrument being of the type having a source providing a collimated beam of analytical radiation, a support for supporting the sample to be analyzed, a detector for detecting the analytical radiation, a

In an analytical instrument designed for testing the transmission and reflection of a sample, the instrument being of the type having a source providing a collimated beam of analytical radiation, a support for supporting the sample to be analyzed, a detector for detecting the analytical radiation, and means for focusing analytical radiation on the detector, the improved beam directing system comprising: primary focusing means, mounted in position to receive the incoming beam from the source, for focusing the beam so received on a sample held in the sample support means, focusing-collimating means for focusing a collimated beam of analytical radiation which is incident thereon onto a sample supported in the sample support and for receiving analytical radiation reflected from the sample and collimating it into a beam which is directed to the means for focusing analytical radiation onto the detector, and intercept means for selectively redirecting a portion of the collimated beam of analytical radiation from the source into the focusing-collimating means such that the redirected portion of the beam will be focused on the sample without moving the sample and the radiation reflected from the sample will be collimated by the focusing-collimating means and directed back past the intercept means to the means for focusing analytical radiation on the detector, wherein the intercept means is activated to test the reflection of the sample, and such that substantially the same focusing-collimating means is used in testing both the reflection and transmission of the sample.