초록 ▼

A device for determining gloss on a surface having a calibrating feature wherein a gloss calibration standard is provided by means of a built-in standardization surface. The standardization surface provides a reference to which the gloss of a sample surface is compared. The standardization surface i

A device for determining gloss on a surface having a calibrating feature wherein a gloss calibration standard is provided by means of a built-in standardization surface. The standardization surface provides a reference to which the gloss of a sample surface is compared. The standardization surface is protected from dust build-up throughout the operation of the device.

대표청구항 ▼

A gloss gauge for optically measuring the gloss of a sample surface when said surface is disposed in a gloss measuring plane, comprising: a light beam source; means for directing an incident light beam from the light beam source to the gloss measuring plane; reflectance sensing means for sensing the

A gloss gauge for optically measuring the gloss of a sample surface when said surface is disposed in a gloss measuring plane, comprising: a light beam source; means for directing an incident light beam from the light beam source to the gloss measuring plane; reflectance sensing means for sensing the intensity of the light beam reflected from the gloss measuring plane; a standardization member having a standardization surface on one side thereof, the standardization surface having a known gloss; an enclosure for excluding reflectance-altering material from the standardization surface, said enclosure including a first transparent member disposed in a wall of the enclosure to transmit the incident light beam from the light beam source to the gloss measuring plane and a second transparent member disposed in a wall of the enclosure to transmit reflected light from the gloss measuring plane to the reflectance sensing means; and an actuator for moving the standardization surface with respect to the enclosure, while maintaining the standardization surface within the enclosure, from a first position which is out of the gloss measuring plane to a second position which is in the gloss measuring plane.