초록 ▼

A system (20) for diagnosing defects in electronic assemblies is disclosed. The system (20) comprises a knowledge base (26) for storing information regarding the electronic assembly for receiving current test failure data regarding an electronic assembly (12). The system further comprises a pattern

A system (20) for diagnosing defects in electronic assemblies is disclosed. The system (20) comprises a knowledge base (26) for storing information regarding the electronic assembly for receiving current test failure data regarding an electronic assembly (12). The system further comprises a pattern search section (36) for comparing current test failure data to information stored in the knowledge base (26). A voting section (40) is also provided for generating a recommended repair procedure to eliminate the defect in the electronic assembly (12). Finally, the system (20) further comprises a historical pattern generation section (46) which updates the knowledge base (26) with information regarding whether the recommended repair procedure eliminated the defect.

대표청구항 ▼

An apparatus for diagnosing a defect in an electronic assmbly in response to current test failure data, said electronic assembly being divided into functional blocks and comprising a plurality of replaceable subassemblies, said apparatus comprising: a knowledge base for storing information regarding

An apparatus for diagnosing a defect in an electronic assmbly in response to current test failure data, said electronic assembly being divided into functional blocks and comprising a plurality of replaceable subassemblies, said apparatus comprising: a knowledge base for storing information regarding said electronic assembly, said information comprising prior test failure data from other assemblies similar to said electronic assembly; means for comparing said current test failure data to information stored in said knowledge base; means for generating a recommended repair procedure to eliminate said defect in said electronic assembly, said knowledge base generating a wait-pattern containing said recommended repair procedure; and means for updating said knowledge base with information regarding whether said recommended repair procedure eliminated said defect, said means for updating said knowledge base generating a ready-pattern from said wait-pattern only when said recommended repair procedure eliminates said defect. A machine implementable method for diagnosing defects in an electronic assembly comprising: providing information regarding said assembly to a knowledge base from a domain expert; generating a recommended repair procedure in response to current test failure data from said electronic assembly, said knowledge base generating a wait-pattern containing said recommended repair procedure; and learning said recommended repair procedure when said recommended repair procedure eliminates said defect, said learning step includes generating a ready-pattern from said wait-pattern only when said recommended repair procedure eliminates said defect.