$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Detachable high-speed opto-electronic sampling probe 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
출원번호 US-0144215 (1988-01-15)
발명자 / 주소
  • Halbout Jean-Marc (Larchmont NY) Ketchen Mark B. (Hadley MA) Moskowitz Paul A. (Yorktown Heights NY) Scheuermann Michael R. (Somers NY)
출원인 / 주소
  • International Business Machines Corporation (Armonk NY 02)
인용정보 피인용 횟수 : 21  인용 특허 : 11

초록

A testing or sampling probe to determine the response of electrical circuits or devices to ultrafast electrical pulses. The probe is detachable from the device being tested. The probe includes a transparent substrate though which optical pulses are focused or directed onto a photoconducting gap. The

대표청구항

Electrical signal sampling probe apparatus responsive to electrical signals at selected points in an electrical circuit comprising: a transparent substrate, electrically conductive signal transmission means disposed on said transparent substrate, said electrically conductive signal transmission mean

이 특허에 인용된 특허 (11)

  1. Mourou Gerard (Rochester NY), Apparatus for switching high voltage pulses with picosecond accuracy.
  2. Chiang ; Alice M., GaP Directed field UV photodiode.
  3. Valdmanis Janis A. (Columbus IN) Mourou Gerard (Rochester NY), Measurement of electrical signals with picosecond resolution.
  4. Pau Louis F. (Grand-Lancy CHX), Method of examining and testing an electric device such as an integrated or printed circuit.
  5. Chiang Alice M. (Weston MA) Denley Brian W. (Melrose MA) Gelpey Jeffrey C. (Peabody MA), Method of making a gap UV photodiode by multiple ion-implantations.
  6. Kattner Lionel E. (Saratoga CA) Youmans Albert P. (Cupertino CA) Shasby Patrick J. (San Jose CA), Multi-point microprobe for testing integrated circuits.
  7. Olsen David E. (Calabasas CA), Non-destructive testing of cooled detector arrays.
  8. Wilson Charles D. (Pittsford NY), Photoreceptor dark current leakage detecting apparatus for xerographic machines.
  9. Miller Emmett L. (Long Beach CA) Shumka Alex (La Canada CA) Gauthier Michael K. (Downey CA), Solar cell anomaly detection method and apparatus.
  10. Pfeiffer Hans C. (Ridgefield CT) Simpson Robert A. (Wappingers Falls NY) Stickel Werner (Ridgefield CT), System for contactless electrical property testing of multi-layer ceramics.
  11. Izu Masatsugu (Birmingham MI) Cannella Vincent D. (Detroit MI), System for eliminating short and latent short circuit current paths in photovoltaic devices.

이 특허를 인용한 특허 (21)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Alfano, Robert R.; Ho, Ping-Pei, Apparatus and method for measuring the time evolution of carriers propogating within submicron and micron electronic devices.
  3. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  4. Aoyagi, Masahiro; Kikuchi, Katsuya; Nakagawa, Hiroshi; Okada, Yoshikuni; Fujita, Hiroyuki; Imai, Shoichi; Kiyota, Shigeo, Contact probe and method of making the same.
  5. Lagowski Jacek (Tampa FL) Jastrzebski Lubek (Tampa FL) Kontkiewicz Andrzej (Warszwawa PLX) Edelman Piotr (Tampa FL), Determining long minority carrier diffusion lengths.
  6. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  7. Strid, Eric; Campbell, Richard, Differential signal probing system.
  8. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  9. Williamson Steven (Ann Arbor MI), Electro-optic signal measurement.
  10. Lagowski Jacek ; Edelman Piotr ; Wilson Marshall D., Measurement of the interface trap charge in an oxide semiconductor layer interface.
  11. Lagowski, Jacek; Faifer, Vladimir; Aleinikov, Andrei, Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages.
  12. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  13. Aoyagi, Masahiro; Kikuchi, Katsuya; Nakagawa, Hiroshi; Okada, Yoshikuni; Fujita, Hiroyuki; Imai, Shouichi; Kiyota, Shigeo, Method of making contact probe.
  14. Tada Tetsuo (Hyogo JPX) Takagi Ryouichi (Hyogo JPX), Method of manufacturing a probing card for wafer testing.
  15. Ohta Hiroko (Hachioji JPX) Takase Tsugiko (Hachioji JPX) Mishima Shuzo (Hachioji JPX) Miyamoto Hirofumi (Hachioji JPX) Okada Takao (Hachioji JPX), Probe unit for an atomic probe microscope.
  16. Tada Tetsuo (Hyogo JPX) Takagi Ryouichi (Hyogo JPX), Probing card for wafer testing and method of manufacturing the same.
  17. Kaneko, Yasuhisa, Semiconductor saturable absorber-based optical domain optical signal sampling device for sampling an optical signal.
  18. Campbell, Richard, Test structure and probe for differential signals.
  19. Wayne Harvey Knox ; Chunhui Xu, Ultra-fast probe.
  20. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  21. Campbell, Richard, Wideband active-passive differential signal probe.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로