초록 ▼

A method for automatic probe offset compensation in a machine for measuring coordinates of a workpiece surface by contacting points on the surface with a probe having a prescribed diameter and sensing and recording the coordinates of the probe. The method can be applied to planar surfaces and circul

A method for automatic probe offset compensation in a machine for measuring coordinates of a workpiece surface by contacting points on the surface with a probe having a prescribed diameter and sensing and recording the coordinates of the probe. The method can be applied to planar surfaces and circularly curved surfaces. The method includes determining a direction point in space just prior to contact with the workpiece surface, determining a directional vector between the direction point and the first contact point, and determining the angle of the directional vector relative to a normal to the surface. When the angle is within a predetermined range of acceptance, the direction point is considered valid. In the case of a planar surface, the measured surface is shifted by the probe offset in a direction opposite the normal vector so that the measured surface and the workpiece surface coincide. In the case of a curved surface, the distance from the direction point to the centerpoint of the measured surface is compared with the radius of the measured surface, and the probe offset is added to or subtracted from the radius so that the measured surface and the workpiece surface coincide. In a further refinement, the direction point is considered invalid if it is within the distribution of measured contact points.

대표청구항 ▼

In a machine for measuring coordinates of a generally planar surface on a workplace by contacting points with a probe having a prescribed diameter and continuously sampling and recording the coordinates of the probe, a method for automatically compensating the planar surface being measured for probe

In a machine for measuring coordinates of a generally planar surface on a workplace by contacting points with a probe having a prescribed diameter and continuously sampling and recording the coordinates of the probe, a method for automatically compensating the planar surface being measured for probe offset comprising the steps of: (a) moving the probe toward the planar surface and measuring the coordinates of a direction point D just before contact between the probe and the planar surface; (b) moving the probe along the planar surface and measuring the coordinates of at least three contact points C1-CN with the probe and the planar surface in contact; (c) fitting by electronic data processing means a plane S to the contact points C1-CN, the plane S being defined by a normal vector Vn passing through the first contact point C1 and a coordinate of the intersection between plane S and vector Vn; (d) calculating by electronic data processing means a directional vector Vd between the first contact point C1 and direction point D; (e) calculating by electronic data processing means an angle A between the normal vector Vn and the directional vector Vd, and when the angle A is greater than 90°, reversing the direction of the normal vector Vn; (f) when the angle A is in the range between the predetermined range of acceptance and 90°, rejecting the direction point D as invalid and repeating the compensation procedure; and (g) when the angle A is within a predetermined range of acceptance, moving the plane S by electronic data processing means by the dimension of the probe offset in a direction opposite the direction of the normal vector Vn so that the plane S coincides with the planar surface, thereby compensating for probe offset.