초록 ▼

A universal microscope for use with a commercial FT-IR spectrophotometer comprises a visible light microscope for selecting and masking an area of a sample and an infrared microscope for sampling the masked area. The visible light microscope and the infrared microscope share a common optical path be

A universal microscope for use with a commercial FT-IR spectrophotometer comprises a visible light microscope for selecting and masking an area of a sample and an infrared microscope for sampling the masked area. The visible light microscope and the infrared microscope share a common optical path between one or more remote sample image plane masks and the sample plane such that both the visible light and the infrared radiant energy are masked twice to spatially define the same area at the sample plane. The first sample image plane mask removes energy from outside the target area at the sample focus. The second sample image plane mask removes energy from outside the target area that is diffracted by the first mask or the focusing optics. The first remote sample image plane is imaged onto the second remote image plane with the radiant energy gaining spectroscopic information and additional image information by passing through or reflecting off a sample located at the intervening sample plane. Samples having a diameter of less than 8 microns have been spectroscopically isolated with 2-25 micron infrared radiant energy.

대표청구항 ▼

A microscope for spectrometry to analyze samples comprising: radiant energy source means to provide an invisible radiant energy beam; a first light source means to provide a visible light beam; a sample plane containing a sample to be analyzed; means to direct either the invisible radiant energy bea

A microscope for spectrometry to analyze samples comprising: radiant energy source means to provide an invisible radiant energy beam; a first light source means to provide a visible light beam; a sample plane containing a sample to be analyzed; means to direct either the invisible radiant energy beam in a sampling mode or the visible light beam in a viewing mode along a common optical path, such path spatially passing through the sample; a first remote sample image plane on the common optical path; a first mask located at the first remote sample image plane in the common optical path remote from the sample such that said invisible radiant energy beam passes through said first mask before impinging upon the sample; a first lens on the common optical path between said first mask and said sample plane to form an image of said sample at the remote sample image plane and an image of the mask at the sample plane; a viewing means located such that said first mask and said remote sample image plane are viewable from the invisible radiant energy source side of the sample; means to vary the size of the first mask during viewing in the viewing mode to spatially define the sample area to a selected targeted arbitrary shape; an invisible radiant energy detector operative in the sampling mode to detect invisible radiant energy passing from said radiant energy source through the first mask, as adjusted, and the first lens to the targeted arbitrary shape of the sample to provide analysis of the sample within the selected targeted arbitrarily shaped area; and a movable optical switching means to direct either invisible radiant energy from the sample to the detector in the sampling mode or visible light to the viewing means in the viewing mode.