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Autofocus system for scanning laser inspector or writer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-001/20
  • G01C-003/08
출원번호 US-0173707 (1988-03-25)
발명자 / 주소
  • Merryman Jerry D. (Dallas TX) Porter Vernon R. (Plano TX)
출원인 / 주소
  • Texas Instruments Incorporated (Dallas TX 02)
인용정보 피인용 횟수 : 48  인용 특허 : 9

초록

A laser pattern inspection and/or writing system which writes or inspects a pattern on a target on a stage, by raster scanning the target pixels. An autofocus keeps the scanning laser beam in focus on the target. The autofocus system includes an objective lens assembly through which a first laser be

대표청구항

An autofocus system for a pattern inspection or writing system, comprising; an objective lens assembly including a fixed long focus lens and a movable objective lens for focusing a first laser beam on the surface of a target for pattern inspection or writing; an autofocus laser fixed to the objectiv

이 특허에 인용된 특허 (9)

  1. Kaneda Naoya (Kanagawa JPX) Toyama Masamichi (Tokyo JPX) Kozuki Susumu (Tokyo JPX) Kohtani Yutaka (Kanagawa JPX) Fujiwara Akihiro (Kanagawa JPX), Automatic focus control system and camera using same.
  2. Minami Masana (Kawasaki JPX) Watanabe Tomohide (Kawasaki JPX), Automatic focusing apparatus.
  3. Iijima Nobuo (Tama JPX), Automatic lens focus with respect to the surface of a workpiece.
  4. Welmers Thomas E. (Reseda CA), Data handling system for a pattern generator.
  5. Uehara, Makoto; Sudo, Takeshi; Kanatani, Fujio, Horizontal position detecting device.
  6. Whitney, Theodore R., Laser pattern generating system.
  7. Berger Laurent (Meylan FRX) Tigreat Paul (Meylan FRX), Optical imaging apparatus.
  8. Yokoi Masakatsu (Kyoto JPX) Harada Tsutomu (Shiga JPX), Picture scanning and recording using a photoelectric focusing system.
  9. Tojo Toru (Kanagawa JPX) Tabata Mitsuo (Yokohama JPX), Position detector by vibrating a light beam for averaging the reflected light.

이 특허를 인용한 특허 (48)

  1. Osterhout, Ralph F.; Haddick, John D.; Lohse, Robert Michael; Cella, Charles; Nortrup, Robert J.; Nortrup, Edward H., AR glasses with event and sensor triggered AR eyepiece interface to external devices.
  2. Osterhout, Ralph F.; Haddick, John D.; Lohse, Robert Michael; Cella, Charles; Nortrup, Robert J.; Nortrup, Edward H., AR glasses with event and sensor triggered control of AR eyepiece applications.
  3. Osterhout, Ralph F.; Haddick, John D.; Lohse, Robert Michael; Cella, Charles; Nortrup, Robert J.; Nortrup, Edward H., AR glasses with event and user action control of external applications.
  4. Haddick, John D.; Osterhout, Ralph F.; Lohse, Robert Michael, Adjustable extension for temple arm.
  5. Klass, Michael Jay, Apparatus for generating random numbers.
  6. Saylor, Stephen D.; Pralle, Martin U., Biometric imaging devices and associated methods.
  7. Su,Hui; Moller,Gregory P., Data sector error handling mechanism.
  8. Su,Hui; Moller,Gregory P., Data sector error tracking and correction mechanism.
  9. Beaty,Elwin M.; Mork,David P., Electronic component products and method of manufacturing electronic component products.
  10. Beaty,Elwin M.; Mork,David P., Electronic component products made according to a process that includes a method for three dimensional inspection.
  11. Osterhout, Ralph F.; Haddick, John D.; Lohse, Robert Michael; Border, John N.; Miller, Gregory D.; Stovall, Ross W., Eyepiece with uniformly illuminated reflective display.
  12. Miller, Gregory D.; Border, John N.; Osterhout, Ralph F., Grating in a light transmissive illumination system for see-through near-eye display glasses.
  13. Jiang, Jutao; Borg, Matt, High dynamic range CMOS image sensor having anti-blooming properties and associated methods.
  14. Carey, James E.; Miller, Drake, High speed photosensitive devices and associated methods.
  15. Thaury, Cédric; Lehe, Rémi; Malka, Victor; Guillaume, Emilien, Laser plasma lens.
  16. Border, John N.; Bietry, Joseph; Haddick, John D.; Lohse, Robert Michael, Light control in head mounted displays.
  17. Askebjer, Per; Rosling, Mats, Maskless writing of a workpiece using a plurality of exposures having different focal planes using multiple DMDs.
  18. Osterhout, Ralph F.; Lohse, Robert Michael, Method and apparatus for biometric data capture.
  19. Beaty Elwin M. ; Mork David P., Method and apparatus for three dimensional inspection of electronic components.
  20. Beaty, Elwin M.; Mork, David P., Method and apparatus for three dimensional inspection of electronic components.
  21. Beaty, Elwin M.; Mork, David P., Method and apparatus for three dimensional inspection of electronic components.
  22. Nemets, Christian; Woelki, Michael; Engineer, Amit V., Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system.
  23. Beaty,Elwin M.; Mork,David P., Method of manufacturing electronic components including a method for three dimensional inspection.
  24. Miller, Gregory D.; Border, John N.; Osterhout, Ralph F., Optical imperfections in a light transmissive illumination system for see-through near-eye display glasses.
  25. Haddad, Homayoon; Jiang, Jutao; McKee, Jeffrey; Miller, Drake; Forbes, Leonard; Palsule, Chintamani, Photosensitive imaging devices and associated methods.
  26. Jiang, Jutao; McKee, Jeffrey; Pralle, Martin U., Photosensitive imaging devices and associated methods.
  27. Pralle, Martin U.; McKee, Jeffrey; Sickler, Jason, Pixel isolation elements, devices and associated methods.
  28. Pralle, Martin U.; McKee, Jeffrey; Sickler, Jason, Pixel isolation elements, devices and associated methods.
  29. Kim Hong J. ; Klass Michael J., Random number generator.
  30. Klass, Michael Jay, Random number generator.
  31. Miller, Gregory D., See-through display with an optical assembly including a wedge-shaped illumination system.
  32. Border, John N.; Bietry, Joseph; Osterhout, Ralph F., See-through near-eye display glasses including a curved polarizing film in the image source, a partially reflective, partially transmitting optical element and an optically flat film.
  33. Border, John N.; Haddick, John D.; Lohse, Robert Michael; Osterhout, Ralph F., See-through near-eye display glasses including a modular image source.
  34. Border, John N.; Haddick, John D.; Osterhout, Ralph F., See-through near-eye display glasses including a partially reflective, partially transmitting optical element.
  35. Border, John N.; Osterhout, Ralph F., See-through near-eye display glasses including an auto-brightness control for the display brightness based on the brightness in the environment.
  36. Border, John N.; Bietry, Joseph; Osterhout, Ralph F., See-through near-eye display glasses wherein image light is transmitted to and reflected from an optically flat film.
  37. Border, John N.; Osterhout, Ralph F., See-through near-eye display glasses with a fast response photochromic film system for quick transition from dark to clear.
  38. Border, John N.; Haddick, John D.; Osterhout, Ralph F., See-through near-eye display glasses with a light transmissive wedge shaped illumination system.
  39. Border, John N.; Haddick, John D.; Osterhout, Ralph F., See-through near-eye display glasses with a small scale image source.
  40. Border, John N.; Haddick, John D.; Osterhout, Ralph F., See-through near-eye display glasses with a small scale image source.
  41. Border, John N.; Haddick, John D.; Lohse, Robert Michael; Osterhout, Ralph F., See-through near-eye display glasses with the optical assembly including absorptive polarizers or anti-reflective coatings to reduce stray light.
  42. Haddick, John D.; Osterhout, Ralph F., System and method for delivering content to a group of see-through near eye display eyepieces.
  43. Campbell,Jeffrey G.; Beiser,Leo, System and method for direct laser engraving of images onto a printing substrate.
  44. Haddick, John D.; Osterhout, Ralph F.; Lohse, Robert Michael, System and method for social networking gaming with an augmented reality.
  45. Haddad, Homayoon; Feng, Chen; Forbes, Leonard, Three dimensional imaging utilizing stacked imager devices and associated methods.
  46. Beaty Elwin M. ; Mork David P., Three dimensional inspection system.
  47. Beaty Elwin M. ; Mork David P., Three dimensional inspection system.
  48. Aghajan, Hamid K., Two-dimensional scatter plot technique for defect inspection.
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