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특허 상세정보

System and method for analyzing dimensions of can tops during manufacture

국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) G01N-021/86   
미국특허분류(USC) 250/560 ; 356/376 ; 413/66
출원번호 US-0234893 (1988-08-22)
발명자 / 주소
출원인 / 주소
인용정보 피인용 횟수 : 19  인용 특허 : 5
초록

A can top measuring system is disclosed, including a rotatable turntable (40) containing can top receiving apertures (44). The turntable (40) may also be translated in either the X or Y direction. A differential height sensor (50) surrounds the can top (70) in order that two laser ranger finders (51,52) may emit beams toward opposite sides of the can top (70), the reflected beams being sensed by two dimensional detector arrays (58, 60). Height measurements can also be accomplished by an autofocusing optical system (28) movable along the Z axis. A score l...

대표
청구항

A system for making precision measurements of different parameters of a metal can top as it is progresses through various stages in a manufacturing process involving multiple forming steps, comprising: a base having a working area surface and including a bridge spanning across the working area surface; stage means movable in X and Y directions in a horizontal plane on the base over the working area surface; rotary table means disposed on the X,Y stage means and including means in a number of positions in a horizontal plane for receiving can tops followin...

이 특허를 인용한 특허 피인용횟수: 19

  1. Lapham, John R.. Automation equipment control system. USP2013068473202.
  2. Lapham, John R.. Automation equipment control system. USP2014068761932.
  3. Lapham, John R.. Automation equipment control system. USP2011118050797.
  4. Santamaria, Alejandro J.; Mathabel, Richard R.; Boysel, Darl G.. Can end, tooling for manufacture of the can end and seaming chuck adapted to affix a converted can end to a can body. USP2004056736283.
  5. Selbrede,Martin G.; Gobeli,Garth; Cox,B. Tod; Van Ostrand,Daniel K.; Kykta,Martin A.. Corner-cube retroreflectors for displays. USP2008117450799.
  6. Jackson Robert Lea (Moorpark CA) Boman Robert Cottle (Simi Valley CA). Grid array inspection system and method. USP1997075652658.
  7. Jackson Robert Lea ; Boman Robert Cottle. Grid array inspection system and method. USP1998095812268.
  8. Kanamori, Hiroyuki; Saeki, Takeshi; Sonobe, Hirato. Image measuring apparatus. USP2013118576280.
  9. Zonker, Harry R.; Myers, Gary L.; Dick, Robert E.; Boysel, Darl G.; Ward, John S.. Metal end shell and easy opening can end for beer and beverage cans. USP2004076761280.
  10. Fujiwara, Kota; Yamanaka, Yoshiro; Kawaguchi, Michihiro; Shiba, Kazuhiro. Method for detecting substrate position of charged particle beam photolithography apparatus and charged particle beam photolithography apparatus. USP2012088237139.
  11. Lev M. Bolotin. Modular off-line micro device processing system. USP2002046381516.
  12. Ohren, Dennis L.; Voges, Christopher J.; Rotering, Andrew E.. On-axis focus sensor and method. USP2017039594230.
  13. Pine, Jeffrey Augustus; Lee, Wei. Optical imaging system and method using a reflective background. USP2012058170322.
  14. Van Ostrand, Daniel K.; King, Carey; Gobeli, Garth. Optical microstructures for light extraction and control. USP2012078218920.
  15. Van Ostrand, Daniel K.; King, Carey; Gobeli, Garth. Optical microstructures for light extraction and control. USP2013028380026.
  16. Hashimoto Yutaka,JPX ; Sasaki Hideaki,JPX ; Kobayashi Mamoru,JPX ; Kazui Shinichi,JPX. Solder bump measuring method and apparatus. USP2001036196441.
  17. Hashimoto Yutaka,JPX ; Sasaki Hideaki,JPX ; Kobayashi Mamoru,JPX ; Kazui Shinichi,JPX. Solder bump measuring method and apparatus. USP1999055906309.
  18. Yutaka Hashimoto JP; Hideaki Sasaki JP; Mamoru Kobayashi JP; Shinichi Kazui JP. Solder bump measuring method and apparatus. USP2002016340109.
  19. John R. Lapham. Versatile robot control system. USP2002086442451.