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Method and apparatus for tracking, mapping and recognition of spatial patterns 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-015/50
  • G06F-015/70
출원번호 US-0154048 (1988-02-09)
발명자 / 주소
  • Chotiros Nicholas P. (1508 Charolais Dr. Austin TX 78758)
인용정보 피인용 횟수 : 129  인용 특허 : 15

초록

A method and apparatus for the identification of spatial patterns that occur in two or more scenes or maps. Each pattern comprises a set of points in a spatial coordinate system collectively represented by the geometrical figure formed by connecting all point pairs by straight lines. The pattern rec

대표청구항

A pattern recognition system comprising: means for periodically generating a scene comprising a plurality of data points, each said data point comprising the position of and a unique identifier assigned to a point in space; means for prestoring a map comprising a plurality of said data points repres

이 특허에 인용된 특허 (15)

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