초록 ▼

Apparatus and method for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like, involving storing digital signal information representing an image of the desired predetermined object shapes to be learned by an image inspect

Apparatus and method for automatically inspecting objects and identifying or recognizing known and unknown portions thereof, including defects and the like, involving storing digital signal information representing an image of the desired predetermined object shapes to be learned by an image inspecting system and recognized during scanning of objects to be inspected, and modifying the stored digital signal information to create a fictitious image of the object shapes to be learned that incorporates acceptable size or dimension variations and the like in such objects such that during the inspecting of future objects, these acceptable variations will be ignored as defects or unknown elements.

대표청구항 ▼

A method of inspection of circuit board conductive shapes wherein digital signal information is stored representing desired shapes to be monitored in future board inspections, the method comprising, originally storing digital signal information representing images of desired predetermined object sha

A method of inspection of circuit board conductive shapes wherein digital signal information is stored representing desired shapes to be monitored in future board inspections, the method comprising, originally storing digital signal information representing images of desired predetermined object shapes to be learned; predetermining at least one of acceptable size or dimension variations in such object shapes; modifying the stored digital signal information to create a set of fictitious images of said object shapes to be learned that incorporates the acceptable variations therein; storing the modified digital signal information representing said fictitious images; and, during circuit board inspections, ignoring said acceptable variations as possible defects by responding to recognition of the acceptable variations in the said fictitious stored images.