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Optical profile measuring apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/24
  • G01B-011/10
출원번호 US-0192584 (1988-05-09)
발명자 / 주소
  • Thomas Alan E. (Tulsa OK) Thompson Leon E. (Slippery Rock PA)
출원인 / 주소
  • Glass Technology Development Corporation (Sapulpa OK 02)
인용정보 피인용 횟수 : 47  인용 특허 : 17

초록 ▼

An apparatus for measuring the profile of portions of an article located within a predefined plane. Each portion is scanned, such as by an optical micrometer providing a beam of radiant energy, to determine its dimension. The distance between each portion and a vertical reference is also scanned to

대표청구항 ▼

An apparatus for measuring a profile of portions of an article by determining the spatial relationship between portions, said apparatus comprising: means for aligning the portions of the article article to be profiled with a predefined plane; and means for measuring the width of each portion of the

이 특허에 인용된 특허 (17)

  1. Tourres Francois G. (Octeville-sur-Mer FRX), Apparatus and method for optical control of the profile of a body utilizing a planar laser beam.
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  2. Shiraishi Takashi (Nagaokakyo JPX) Kitamura Shirou (Tsuzuki JPX), Apparatus for measuring diameter of cutting portion of drill.
    상세보기
  3. Forbes James A. (P.O. Box 854 Doylestown PA 18901), Apparatus for optically scanning an object.
    상세보기
  4. Zanoni Carl A. (MIddletown CT), Apparatus for producing a scanning laser beam of constant linear velocity.
    상세보기
  5. Dehait ; Jack T. ; Dietz ; David C. ; Snyder ; Milo S. ; Talor ; Francis M., Calibrated optical micrometer.
    상세보기
  6. Coates Vincent J. (Cupertino CA), Computerized micromeasuring system and method therefor.
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  7. Hinds James J. (LeGrange IL) Hoeflich John C. (Oak Park IL) Kolodziej George C. (Oak Park IL), Container defect monitoring system.
    상세보기
  8. Dehait ; Jack T., Half-maximum threshold circuit for optical micrometer.
    상세보기
  9. Juvinall John W. (Ottawa Lake MI), Identification of a molded container with its mold of origin.
    상세보기
  10. Petrohilos Harry G. (Yellow Springs OH) Taylor Francis M. (Xenia OH), Light beam shape control in optical measuring apparatus.
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  11. King, David P.; Barker, Robert I., Method and apparatus for measuring a dimension of an object in a defined space by scanning with a light beam.
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  12. Schulz Wolfgang (Mettmann DEX) Himmler Gnther (Darmstadt DEX) Knoll Gnter (Bttelborn DEX) Wenz Friedrich (Seeheim-Jugenheim DEX), Method and apparatus for non-contact determination of run-out of a rotating body.
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  13. Nakata Kazuo (Fujisawa JPX) Iochi Akihiko (Odawara JPX) Kaise Isamu (Fujisawa JPX) Takeuchi Kazuo (Kamakura JPX) Nomura Katsuhiko (Kamakura JPX), Method for automatic, non-destructive measurement of eccentricity of coated electrodes.
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  14. Planke Tore (Nykirke NOX), Method for contour recognition of totally or partly transparent objects, e.g., bottles.
    상세보기
  15. Taylor ; Francis M., Optical dimension measuring device employing an elongated focused beam.
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  16. Harris David E. (Columbus OH) Watson Robert M. (Columbus OH) Redmyer John D. (Columbus OH), Reticle calibrated diameter gauge.
    상세보기
  17. Chen Tung Chang (Villanova PA) Chen Thomas M. (Doylestown PA), System for monitoring the production of items which are initially difficult to physically inspect.
    상세보기

이 특허를 인용한 특허 (47)

  1. Kolodge, Kenneth S.; Nygaard, Michael G.; Nygaard, Gregory M., Apparatus for quickly retaining and releasing parts to be optically measured.
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  2. Spalding, John D., Calibration device for use in an optical part measuring system.
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  3. Spalding, John D., Calibration device for use in an optical part measuring system.
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  4. Kohler, Timothy A.; Graff, Stephen M.; Hall, Jr., George H., Container inspection apparatus and method.
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  5. Juvinall John W. ; Ringlien James A. ; Shepherd William T., Container sealing surface area inspection.
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  6. Juvinall John W. ; Ringlien James A. ; Shepherd William T., Container sealing surface area inspection.
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  7. Ringlien James A., Container sealing surface area inspection.
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  8. Nordbryhn Andreas,NOX, Device for generating, detecting and recognizing a contour image of a liquid container.
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  9. Wurz Albert ; Romaine John E. ; Martin David L., Dimensioning system.
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  10. Wurz Albert ; Romaine John E. ; Martin David L., Dimensioning system.
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  11. Kujacznski, Nathan Andrew-Paul; St. Onge, James W.; Nygaard, Michael G., High speed method and system for inspecting a stream of parts.
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  12. Kujacznski, Nathan Andrew-Paul; St. Onge, James W.; Nygaard, Michael G., High speed method and system for inspecting a stream of parts at a pair of inspection stations.
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  13. Fleming, Christopher C.; Nygaard, Michael G., High-resolution imaging and processing method and system for determining a geometric dimension of a part.
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  14. Fleming, Christopher C.; Nygaard, Michael G., High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined.
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  15. Kujacznski, Nathan Andrew-Paul; Nygaard, Michael G., High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
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  16. Nygaard, Michael G., High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
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  17. Bernard I. Levine, Laser alignment system for saws with rotating blades.
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  18. Semersky,Frank E.; Witham,Daniel L.; Koskie,Stephen K., Laser system for measurements of the profile of objects.
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  19. Leconte, Marc; Garin, Jean-François, Method and device for measuring the verticality of a container.
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  20. Nygaard, Michael G.; Nygaard, Gregory M.; Nygaard, George M.; Spalding, John D., Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts.
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  21. Nygaard, Gregory M.; Strickland, David A., Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station.
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  22. Nygaard, Michael G.; St. Onge, James W.; Kujacznski, Nathan Andrew-Paul; Poletti, Laura L., Method and system for inspecting a manufactured part at an inspection station.
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  23. Nygaard, Michael G., Method and system for inspecting parts utilizing triangulation.
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  24. Nygaard, Michael G.; Poletti, Laura L., Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis.
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  25. Offenborn, Robert Joseph; Alexander, Christopher Michael; Nygaard, Gregory Martin; Nygaard, Michael George, Method and system for optically inspecting headed manufactured parts.
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  26. Offenborn, Robert Joseph; Alexander, Christopher Michael; Nygaard, Gregory Martin; Nygaard, Michael George, Method and system for optically inspecting headed manufactured parts.
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  27. Nygaard, Michael G., Method and system for optically inspecting manufactured rounds of ammunition or cylindrical components of the rounds to obtain rounds which exhibit superior accuracy when fired.
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  28. Nygaard, Michael G., Method and system for optically inspecting outer peripheral surfaces of parts.
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  29. Nygaard, Michael G., Method and system for optically inspecting parts.
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  30. Nygaard, Michael G., Method and system for optically inspecting parts.
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  31. Nygaard, Michael G.; Kujacznski, Nathan Andrew-Paul, Method and system for optically inspecting parts.
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  32. Nygaard, Michael G.; Nygaard, Gregory M.; Nygaard, George M.; Spalding, John D., Method and system for optically inspecting parts.
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  33. Walstra, Eric M., Method and system for optically inspecting parts.
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  34. Nygaard, Michael G., Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis.
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  35. Spalding, John D., Method for estimating thread parameters of a part.
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  36. Spalding, John D.; Walstra, Eric M., Method for precisely measuring position of a part to be inspected at a part inspection station.
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  37. Nygaard, Michael G.; Kujacznski, Nathan Andrew-Paul, Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis.
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  38. Juvinall,John W.; Ringlien,James A.; Graff,Stephen M.; Chen,Jie; Anderson,William H., Optical inspection apparatus and method for inspecting container lean.
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  39. Ringlien James A. (Maumee OH), Optical inspection of container finish dimensional parameters.
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  40. Spalding, John D.; Bourget, Paul L.; Brunt, Jr., Harold W., Optical modules and method of precisely assembling same.
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  41. Crowther, David, Profile inspection system for threaded and axial components.
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  42. Bonewitz Manuel ; Kosta Bozidar, System and method for image acquisition for inspection of articles on a moving conveyor.
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  43. Hartman, Richard L., System and method for measuring the dimensions of moving packages.
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  44. Bonewitz Manuel ; Kosta Bozidar ; Parniawski Richard, System and method for stress detection in a molded container.
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  45. Wurz, Albert; Romaine, John E.; Martin, David L., System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface.
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  46. Lee, Brett J.; McLean, Jacob A.; Nygaard, Michael G., System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station.
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  47. Douglas Robert J. ; Kosta Bozidar ; Gormley Coleman W. ; Krajcik Edward R. ; Spiteri Philippe, Systems and methods for identifying a molded container.
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