초록 ▼

A pattern recognition process and apparatus automatically extracts features in displays, images, and complex signals. Complex signals are processed to two- or higher-dimensional displays or other imagery. The displays or other imagery are then processed to produce one or more visual fields in which

A pattern recognition process and apparatus automatically extracts features in displays, images, and complex signals. Complex signals are processed to two- or higher-dimensional displays or other imagery. The displays or other imagery are then processed to produce one or more visual fields in which regions with certain properties are enhanced. The enchanced regions are induced to produce attractive forces. Flexible templates placed in the visual fields are acted upon by the attractive forces, causing the templates to deform in such a way as to match features which are similar, but not identical to, the template. The deformed templates are then evaluated in order to identify or interpret the feature to which the template was attracted. Apparatus utilizing the process generates a display of the features extracted from the input signal. Desired information can be obtained from such a display, such as trajectories, the location of ridges, buildings, edges, or other boundaries. The extracted features can be used within a control system to automatically guide an object, such as a vehicle or airplane, along a desired course; or within a signal processing system to provide a display of the features in a way that aids in the interpretation of such features.

대표청구항 ▼

A method of extracting features from source signals, such as image signals, display signals, and similar complex signals, comprising the steps of: (a) producing a display field of said source signal having two or more dimensions; (b) generating a force field around areas of said display field having

A method of extracting features from source signals, such as image signals, display signals, and similar complex signals, comprising the steps of: (a) producing a display field of said source signal having two or more dimensions; (b) generating a force field around areas of said display field having selected properties, such as those areas having a prescribed intensity; (c) placing at least one movable and deformable template in the display field that is acted upon by said force field; and (d) evaluating at least one characteristic of said template after said template has been acted upon by said force field, said force field causing said template to move and/or deform in response to the forces present within said force field, said at least one characteristic providing an indication of a feature present within said source signal.