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Coordinate measuring and testing machine 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-007/03
  • G01B-007/28
출원번호 US-0317617 (1989-03-01)
우선권정보 DE-3806686 (1988-03-02)
발명자 / 주소
  • Gurny Werner (Wadgassen DEX)
출원인 / 주소
  • Wegu-Messtechnik GmbH (Wadgassen DEX 03)
인용정보 피인용 횟수 : 32  인용 특허 : 10

초록

Multi-coordinate measuring and testing machine which is essentially constituted from a fundamental machine unit, a scanning or sensing system which is movable in at least two coordinate directions, and a machine-controlling unit. The scanning or sensing system is constructed as a multi-sensor system

대표청구항

Multi-coordinate measuring and testing installation, comprising a fundamental machine unit; a scanning system movable in at least two coordinate directions; and a machine control unit, said scanning system being a multi-sensor scanning system constituted of a mechanical probe having at least one sen

이 특허에 인용된 특허 (10)

  1. Brown Ronald D. (Mapleton IL), Adaptive welder with laser TV-scanner.
  2. Jenks, Earl D., Contour line scanner.
  3. Iwano Hideo (Kawasaki JPX) Shudo Kazuo (Kawasaki JPX), Coordinate measuring instrument.
  4. Williams Gerald B. (Port Talbot GB7), Determining the dimensions of workpieces.
  5. Preysman Vladimir (Santa Clara CA), Hub hole characterization system.
  6. Green Leland D. (Sierra Madre CA), Imagery with constant range lines.
  7. Moermann Werner H. (Hofstrasse 104 CH-8044 Zuerich CHX) Brandestini Marco (Gartenstrasse 10 CH-8702 Zollikon CHX), Method and apparatus for the fabrication of custom-shaped implants.
  8. Penney Carl M. (Schenectady NY), Method and system for determining surface profile information.
  9. Iwano Hideo (Kawasaki JPX), Method of measuring by coordinate measuring instrument and coordinate measuring instrument.
  10. Takagi Yusuke (Hitachi JPX) Kojima Yoshio (Hitachi JPX) Moriguti Kazuo (Hitachi JPX) Takakusagi Tsunehiko (Hitachi JPX), Method of measuring shape of object in non-contacting manner.

이 특허를 인용한 특허 (32)

  1. Ohtsuka, Masaru, Apparatus and method for measuring a shape using multiple probes.
  2. Gurny, Werner H., Apparatus for measuring a measurement object.
  3. Christoph,Ralf, Arrangement for measuring the geometry or structure of an object.
  4. Polidor, Edward T.; Sheehan, Kenneth L.; LaPlaca, Joseph C., Articulated head with multiple sensors for measuring machine.
  5. Sesko, David William, Chromatic range sensor probe detachment sensor.
  6. Ruck Otto,DEX ; Bernhardt Ralf,DEX ; Wimmer Martin,DEX, Coordinate measuring apparatus and method for controlling the same.
  7. Engel, Thomas, Coordinate measuring device having positional change sensors.
  8. Yu, Dahai; Moch, Thomas; De Vlieghere, Bart, Inspection program editing environment including real-time feedback related to throughput.
  9. Yu, Dahai; Tseo, Eric Yeh-Wei; De Vlieghere, Bart; Peter, Michael, Inspection program editing environment providing user defined collision avoidance volumes.
  10. Kelley, Brenan N.; Fawell, Kareem G.; Buza, Matthew; Yu, Dahai, Inspection program editing environment providing user defined collision avoidance volumes with integral modification properties.
  11. Yu, Dahai; Tseo, Eric Yeh-Wei, Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions.
  12. Yu, Dahai; Tseo, Eric Yeh-Wei; De Vlieghere, Bart, Inspection program editing environment with simulation status and control continually responsive to selection operations.
  13. Jones, Benjamin Keith; Harsila, Scott Allen; Patzwald, Andrew Michael; Sesko, David William, Interchangeable chromatic range sensor probe for a coordinate measuring machine.
  14. Jones, Benjamin Keith; Harsila, Scott Allen; Patzwald, Andrew Michael; Sesko, David William, Interchangeable chromatic range sensor probe for a coordinate measuring machine.
  15. Jones, Benjamin Keith; Harsila, Scott Allen; Patzwald, Andrew Michael; Sesko, David William, Interchangeable optics configuration for a chromatic range sensor optical pen.
  16. Harsila, Scott Allen; Sesko, David William, Measurement device with multiplexed position signals.
  17. Ishizu, Kazuhiro; Yamamoto, Takeshi, Measuring instrument.
  18. Wakaoka Shunske,JPX ; Hasebe Takao,JPX, Measuring method of sphericity of ball end mill.
  19. Abitbol Marc,ILX ; Maillart Jean-Luc,FRX, Method and apparatus for identifying the position in three dimensions of a movable object such as a sensor or a tool car.
  20. Lugtenburg, Jan Bernd, Method and device for measuring an object for measurement.
  21. Bumgardner, Jon David, Method for controlling motion of a coordinate measuring machine.
  22. Breyer Karl-Hermann (Heidenheim DEX) Koch Klaus-Peter (Aalen DEX) Heier Helmut (Aalen DEX) Pressel Hans-Gerd (Aalen DEX), Method of making coordinate measurements on workpieces.
  23. Court Nigel Timothy,GB3 ; Hayes-Pankhurst Richard Paul,GB3 ; Evans Neil Laurence,AUX ; Anderson Judith Marjorie,GB3 ; Holbrook Roy,GB3 ; Stephenson Peter Richard,GB3 ; Weightman Arthur Maurice,GB3, Methods and apparatus for monitoring the growth of microorganisms in liquid culture.
  24. Gladnick,Paul; Harsila,Scott, Multi-range non-contact probe.
  25. Gladnick, Paul, Non-contact probe control interface.
  26. Sesko, David William, Optical configuration for measurement device.
  27. Gurny, Eric; Obotnine, Alexandre, Optical sensor device.
  28. Ives, Thomas Wayne; Nelson, Terry M.; Hirst, Bartley Mark, Single-facet spindle implementation for a laser scanner system.
  29. Matsumiya, Sadayuki; Omori, Yoshiyuki; Arita, Sadaharu; Hirano, Kotaro; Fukumoto, Yasushi; Komatsu, Koichi; Takemura, Fumihiro, Surface texture measuring machine and a surface texture measuring method.
  30. Rockstroh, Todd Jay; Hoffman, James Joseph, System and method for adjusting performance of manufacturing operations or steps.
  31. Tseo, Eric Yeh-Wei; Yu, Dahai, System and method for programming workpiece feature inspection operations for a coordinate measuring machine.
  32. Asanuma, Susumu, Transfer apparatus of testing master block for measuring machine.
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