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Electro-optic signal measurement 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-029/14
출원번호 US-0355514 (1989-05-23)
발명자 / 주소
  • Williamson Steven (Ann Arbor MI)
출원인 / 주소
  • The University of Rochester (Rochester NY 02)
인용정보 피인용 횟수 : 44  인용 특허 : 6

초록

Electro-optic probes which are adapted to be placed in the fringe field from electrical signals propagating on conductors (which may be conductors of an integrated circuit) and which modulate optical pulses passing therethrough, for example by modulating the polarization of the light in accordance w

대표청구항

In a system for electro-optically measuring an electrical signal which produces a field with an electro-optic element through which said field passes and through which an optical signal also passes and is modulated by said field, said measurement being in accordance with the modulation of said optic

이 특허에 인용된 특허 (6)

  1. Apsley Norman (Malvern GB2), Electro-optical device.
  2. Mourou Gerard (Rochester NY) Meyer Kevin E. (Rochester NY), Measurement of electrical signals with subpicosecond resolution.
  3. Mourou Gerard (Rochester NY) Valdmanis Janis A. (Westfield NJ), Measurement of electrical signals with subpicosecond resolution.
  4. Roggero Arnaldo (Milan ITX) Bruzzone Mario (Milan ITX), Method for the termination of living polymers, and compounds suitable for the purpose.
  5. Emery Franklin T. (Greentree PA) Lenderking Bruce N. (Glen Burnie MD) Couch Robert D. (New Freedom PA), On-line RF arc monitor for large rotating generators.
  6. Morgan Peter J. (Allen TX) Carter Andrew C. (Northamptonshire GB2) Davis Richard (Northamptonshire GB2) Randle Frederick A. (Northamptonshire GB2), Optical connecting arrangements.

이 특허를 인용한 특허 (44)

  1. Leedy, Glenn J, Adjacent substantially flexible substrates having integrated circuits that are bonded together by non-polymeric layer.
  2. Leedy,Glenn J, Apparatus and methods for maskless pattern generation.
  3. Takahashi Hironori (Hamamatsu JPX) Aoshima Shinichiro (Hamamatsu JPX) Hirano Isuke (Hamamatsu JPX), Electro-optic apparatus for measuring an electric field of a sample.
  4. Kane, Daniel J., Electro-optic electric field probe.
  5. Fumio Akikuni JP; Katsushi Ohta JP; Mitsuru Shinagawa JP; Tadao Nagatsuma JP; Junzo Yamada JP, Electro-optic sampling prober.
  6. Xi-Cheng Zhang ; Zhiping Jiang CA, Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse.
  7. Zhang Xi-Cheng ; Riordan Jenifer Ann ; Sun Feng-Guo, Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation.
  8. Zhang Xi-Cheng ; Libelo Louis Francis ; Wu Qi, Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation.
  9. Leedy, Glenn J, Flexible and elastic dielectric integrated circuit.
  10. Leedy, Glenn J, Lithography device for semiconductor circuit pattern generation.
  11. Leedy,Glenn J, Lithography device for semiconductor circuit pattern generator.
  12. Leedy,Glenn J, Membrane 3D IC fabrication.
  13. Leedy,Glenn J, Membrane 3D IC fabrication.
  14. Leedy,Glenn J, Membrane 3D IC fabrication.
  15. Leedy, Glenn J, Membrane IC fabrication.
  16. Reano, Ronald M.; Whitaker, John F.; Katehi, Linda P. B., Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe.
  17. Zhang, Xi-Cheng; Jiang, Zhiping, Method of characterizing free-space radiation using a chirped optical pulse.
  18. Leedy,Glenn J, Method of information processing using three dimensional integrated circuits.
  19. Leedy,Glenn J, Method of making an integrated circuit.
  20. Leedy,Glenn J, Methods for maskless lithography.
  21. Ohta Hiroko (Hachioji JPX) Takase Tsugiko (Hachioji JPX) Mishima Shuzo (Hachioji JPX) Miyamoto Hirofumi (Hachioji JPX) Okada Takao (Hachioji JPX), Probe unit for an atomic probe microscope.
  22. Whitaker, John Firman; Yang, Kyoung; Katehi, Linda P. B., Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system.
  23. Leedy, Glenn J., Stacked integrated memory device.
  24. Leedy, Glenn J, Stress-controlled dielectric integrated circuit.
  25. Leedy, Glenn Joseph, Stress-controlled dielectric integrated circuit.
  26. Leedy, Glenn J, Three dimension structure memory.
  27. Leedy, Glenn J, Three dimensional memory structure.
  28. Leedy, Glenn J, Three dimensional memory structure.
  29. Leedy, Glenn J, Three dimensional multi layer memory and control logic integrated circuit structure.
  30. Leedy,Glenn J, Three dimensional structure integrated circuit.
  31. Leedy, Glenn J, Three dimensional structure memory.
  32. Leedy, Glenn J, Three dimensional structure memory.
  33. Leedy, Glenn J., Three dimensional structure memory.
  34. Leedy, Glenn J., Three dimensional structure memory.
  35. Leedy, Glenn J., Three dimensional structure memory.
  36. Leedy, Glenn J., Three dimensional structure memory.
  37. Leedy, Glenn J., Three dimensional structure memory.
  38. Leedy, Glenn J., Three dimensional structure memory.
  39. Leedy, Glenn J., Three dimensional structure memory.
  40. Leedy,Glenn J, Three dimensional structure memory.
  41. Leedy,Glenn J., Three dimensional structure memory.
  42. Wayne Harvey Knox ; Chunhui Xu, Ultra-fast probe.
  43. Leedy, Glenn J, Vertical system integration.
  44. Leedy, Glenn J, Vertical system integration.
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