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Atomic force microscope with optional replaceable fluid cell

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/86
출원번호 US-0322001 (1989-03-13)
발명자 / 주소
  • Hansma Paul K. (Santa Barbara CA) Drake Barney (Santa Barbara CA)
출원인 / 주소
  • The Regents of the University of California (Berkeley CA 02)
인용정보 피인용 횟수 : 46  인용 특허 : 1

초록

An atomic force microscope which is readily useable for researchers for its intended use without extensive lost time for setup and repair. The probe used therein is a cantilevered optical lever which imparts surface information in a gentle and reliable manner by reflecting an incident laser beam. Th

대표청구항

An atomic force microscope which is quickly and easily set up and in which the probe thereof is easily replaceable and resists breakage during setup comprising: (a) a horizontal base member; (b) a scan tube vertically supported at a bottom end by said base member and having a top surface for holding

이 특허에 인용된 특허 (1)

  1. Kaiser William J. (West Covina CA) Bell L. Douglas (Pasadena CA), Tunnel and field effect carrier ballistics.

이 특허를 인용한 특허 (46)

  1. Adderton,Dennis M.; Minne,Stephen C., Active probe for an atomic force microscope and method for use thereof.
  2. Lindig, Darin D.; Holden, Anthony P., Atomic force microscope.
  3. Jung Pan S. (Gilbert AZ) Yaniv Daphna R. (Scottsdale AZ), Atomic force microscope employing beam tracking.
  4. Jung Pan S. ; Yaniv Daphna R., Atomic force microscope employing beam-tracking.
  5. Xu Shaohua ; Arnsdorf Morton F., Atomic force microscope for biological specimens.
  6. Hansma Paul K. ; Schaffer Tilman E. ; Cleveland Jason P., Atomic force microscope for generating a small incident beam spot.
  7. Amer Nabil Mahmoud ; Meyer Gerhard,DEX, Atomic force microscopy.
  8. Hayashi Yoshiaki,JPX ; Itoh Shuichi,JPX, Cantilever tracking type scanning probe microscope.
  9. Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C., Cantilevered probe detector with piezoelectric element.
  10. Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C., Cantilevered probe detector with piezoelectric element.
  11. Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C., Cantilevered probe detector with piezoelectric element.
  12. Adams, Jesse D.; Sulchek, Todd A.; Feigin, Stuart C., Cantilevered probe detector with piezoelectric element.
  13. Adams, Jesse D.; Rogers, Benjamin S.; Sulchek, Todd A., Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection.
  14. Adams, Jesse D.; Rogers, Benjamin S.; Sulchek, Todd A., Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detection.
  15. Han Wenhai ; Lindsay Stuart M. ; Jing Tianwei, Cantilevers for a magnetically driven atomic force microscope.
  16. Adams, Jesse D.; Rogers, Benjamin S., Chemical sensor with oscillating cantilevered probe and mechanical stop.
  17. Lindsay Stuart M. (Tempe AZ), Formation of a magnetic film on an atomic force microscope cantilever.
  18. Tilman Schaffer ; Paul K. Hansma, High sensitivity deflection sensing device.
  19. Kawakatsu, Hideki, Interferometric apparatus utilizing a cantilever array to measure a surface.
  20. Binnig Gerd Karl,SEX ; Haeberle Walter,SEX, Investigation and/or manipulation device for a sample in fluid.
  21. Adams,Jesse D.; Rogers,Benjamin S.; Sulchek,Todd A., Liquid cell and passivated probe for atomic force microscopy and chemical sensing.
  22. Han Wenhai ; Lindsay Stuart M. ; Jing Tianwei, Magnetic modulation of force sensor for AC detection in an atomic force microscope.
  23. Jähnke, Torsten; Müller, Torsten; Poole, Kathryn Anne; Knebel, Detlef, Measuring probe device for a probe microscope, measuring cell and scanning probe microscope.
  24. Elings Virgil B. (Santa Barbara CA), Methods of operating atomic force microscopes to measure friction.
  25. Sulchek, Todd A.; Alexeev, Alexander; Wang, Gonghao, Microfluidic device for separation of particles.
  26. Lindsay Stuart M. (Tempe AZ), Microscope for force and tunneling microscopy in liquids.
  27. Sulchek, Todd A.; Qiu, Siping Roger; Noga, Damien J.; Schoenwald, David K., Molded microfluidic fluid cell for atomic force microscopy.
  28. Park, Sang-Il; Smith, Ian R., Optical system for scanning microscope.
  29. Stewart, Ray F., Phase change sensor.
  30. Ray, David J, Removable probe sensor assembly and scanning probe microscope.
  31. Gamble, Ronald C.; West, Paul E., Scanning force microscope.
  32. Ray David J., Scanning force microscope.
  33. Ray David J., Scanning force microscope and method for beam detection and alignment.
  34. Albrecht Thomas R. (San Jose CA) Dovek Moris-Musa (San Carlos CA) Kirk Michael D. (San Jose CA) Park Sang-Il (Palo Alto CA), Scanning force microscope having aligning and adjusting means.
  35. Ray David J., Scanning force microscope with removable probe illuminator assembly.
  36. Honma Katsunori,JPX ; Muramatsu Hiroshi,JPX ; Chiba Norio,JPX, Scanning near-field optic/atomic-force microscope with observing function in liquid.
  37. Hyo-Sok Ahn KR; Choong Hyun Kim KR; Sergei A. Chizhik BY; Oleg Y. Komkov BY; Andrei M. Dubravin BY, Scanning probe microscope.
  38. Kajimura Hiroshi,JPX, Scanning probe microscope.
  39. Lindsay Stuart M. (Tempe AZ) Jing Tianwei (Tempe AZ), Scanning probe microscope.
  40. Lindsay Stuart M. ; Jing Tianwei, Scanning probe microscope.
  41. Park Sano-Il ; Linker Frederick I. ; Smith Ian R., Scanning probe microscope having a single viewing device for on-axis and oblique optical views.
  42. Ray David J., Scanning probe microscope system including removable probe sensor assembly.
  43. Jo, Hyeong Chan; Lim, Hong Jae; Shin, Seung Jun; Kim, Joon Hui; Kim, Yong Seok; Park, Sang-il, Scanning probe microscope with automatic probe replacement function.
  44. Adams, Jesse D., Self-sensing array of microcantilevers for chemical detection.
  45. Schaffer, Tilman; Hansma, Paul K., Summing the output of an array of optical detector segments in an atomic force microscope.
  46. Elings Virgil B. ; Gurley John A., Tapping atomic force microscope with phase or frequency detection.
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