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One transistor flash EPROM cell 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G11C-011/40
출원번호 US-0247887 (1988-09-22)
발명자 / 주소
  • Chang Chi (Redwood City CA)
출원인 / 주소
  • Advanced Micro Devices, Inc. (Sunnyvale CA 02)
인용정보 피인용 횟수 : 50  인용 특허 : 3

초록

An electrically programmable floating gate transistor useful as a one transistor flash EPROM cell includes a multi-thickness dielectric provided on a substrate. The multi-thickness dielectric limits tunnelling from a floating gate provided on the multi-thickness dielectric to a drain during programm

대표청구항

An electrically programmable and erasable semiconductor device, provided on a substrate, comprising: a drain region provided in the substrate; a source region provided in the substrate, said source region comprising a first lightly doped source region and a second heavily doped source region provide

이 특허에 인용된 특허 (3)

  1. Tigelaar Howard L. (Allen TX) Haken Roger A. (Dallas TX) Holloway Thomas C. (Dallas TX), Integrated circuit device and process with tin capacitors.
  2. Harari Eliyahou (2320 Friars La. Los Altos CA 94022), Method of forming non-volatile EPROM and EEPROM with increased efficiency.
  3. Mukherjee Satyen (San Jose CA) Chang Thomas (Santa Clara CA), Single transistor electrically programmable memory device and method.

이 특허를 인용한 특허 (50)

  1. Blanchard, Richard A., Capacitive sensor device with electrically configurable pixels.
  2. Santin Giovanni,ITX, Circuit and method for erasing EEPROM memory arrays to prevent over-erased cells.
  3. Chindalore, Gowrishankar L.; Burnett, James David, Erase of a non-volatile memory.
  4. Gardner, Mark I.; Fulford, H. James; May, Charles E., High performance MOSFET with modulated channel gate thickness.
  5. Sethi Rakesh Balraj ; Norris Christopher S. ; Hu Genda J., High speed flash memory cell structure and method.
  6. Yamazaki, Shunpei; Takemura, Yasuhiko, Laser processing method, method for forming a flash memory, insulated gate semiconductor device and method for forming the same.
  7. Lombardo, Salvatore; Gerardi, Cosimo; Crupi, Isodiana; Melanotte, Massimo, Memory cell structure integrated on semiconductor.
  8. Wang John J. ; He Yuesong ; Chang Kent Kuohua, Method and apparatus for preventing P1 punchthrough.
  9. Yang,Haining, Method and structure for tungsten gate metal surface treatment while preventing oxidation.
  10. Chen Chih-Ming,TWX, Method for manufacturing ETOX cell having damage-free source region.
  11. Wang John J. ; He Yuesong ; Chang Kent Kuohua, Method for preventing P1 punchthrough.
  12. Hsu, Te-Hsun; Chen, Hsin-Ming; Ching, Wen-Hao; Chen, Wei-Ren, Method of fabricating erasable programmable single-poly nonvolatile memory.
  13. Rabkin, Peter; Wang, Hsingya Arthur; Chou, Kai-Cheng, Method of forming a non-volatile memory cell using off-set spacers.
  14. Rabkin, Peter; Wang, Hsingya Arthur; Chou, Kai-Cheng, Method of forming transistors with ultra-short gate feature.
  15. Ghneim Said N. ; Fulford ; Jr. H. Jim, Method of making non-volatile memory device having a floating gate with enhanced charge retention.
  16. Quoc Ngo Dinh,SGX ; Aliyu Yakub,SGX, Method to fabricate a robust and reliable memory device.
  17. Ghneim Said N. ; Fulford ; Jr. H. Jim, Non-volatile memory device having a floating gate with enhanced charge retention.
  18. Seki,Koichi; Wada,Takeshi; Muto,Tadashi; Shoji,Kazuyoshi; Kubota,Yasurou; Kume,Hitoshi, Nonvolatile memory apparatus having a processor and plural memories one or more of which is a nonvolatile memory having circuitry which performs an erase operation and an erase verify operation when the processor specifies the erase operation mode to the nonvolatile memory.
  19. Fastow, Richard M.; Chang, Chi; Derhacobian, Narbeh, Nonvolatile memory cell with a nitridated oxide layer.
  20. James D. Sansbury, Nonvolatile memory cell with multiple gate oxide thicknesses.
  21. Sansbury James D., Nonvolatile memory cell with multiple gate oxide thicknesses.
  22. Yoo,Hyun khe; Han,Jeong uk, Nonvolatile memory device with a non-planar gate-insulating layer and method of fabricating the same.
  23. Seki, Koichi; Wada, Takeshi; Muto, Tadashi; Shoji, Kazuyoshi; Kubota, Yasurou; Kume, Hitoshi, Nonvolatile semiconductor memory apparatus.
  24. Koichi Seki JP; Takeshi Wada JP; Tadashi Muto JP; Kazuyoshi Shoji JP; Yasurou Kubota JP; Hitoshi Kume JP, Nonvolatile semiconductor memory device.
  25. Seki Koichi,JPX ; Wada Takeshi,JPX ; Muto Tadashi,JPX ; Shoji Kazuyoshi,JPX ; Kubota Yasurou,JPX ; Kume Hitoshi,JPX, Nonvolatile semiconductor memory device.
  26. Seki Koichi,JPX ; Wada Takeshi,JPX ; Muto Tadashi,JPX ; Shoji Kazuyoshi,JPX ; Kubota Yasurou,JPX ; Kume Hitoshi,JPX, Nonvolatile semiconductor memory device.
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  30. Seki,Koichi; Wada,Takeshi; Muto,Tadashi; Shoji,Kazuyoshi; Kubota,Yasurou; Kume,Hitoshi, Nonvolatile semiconductor memory device.
  31. Clark, Lawrence T.; Mozdzen, Thomas J., Output buffer for high and low voltage bus.
  32. Walker Andrew J.,NLX ; Cuppens Roger,NLX ; Kronert Alwin N.,NLX, Semiconductor device having a non-volatile memory and method of manufacturing such a semiconductor device.
  33. Hazama, Katsuki, Semiconductor device including transistor with composite gate structure and transistor with single gate structure, and method for manufacturing the same.
  34. Hazama, Katsuki, Semiconductor device including transistor with composite gate structure and transistor with single gate structure, and method for manufacturing the same.
  35. Hazama, Katsuki, Semiconductor device including transistor with composite gate structure and transistor with single gate structure, and method for manufacturing the same.
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  40. Park,Geon Ook, Semiconductor devices and methods of manufacturing the same.
  41. Fujii, Tetsuo; Sakai, Minekazu; Kuroyanagi, Akira, Semiconductor memory device and method of manufacturing the same.
  42. Tetsuo Fujii JP; Minekazu Sakai JP; Akira Kuroyanagi JP, Semiconductor memory device and method of manufacturing the same.
  43. Tetsuo Fujii JP; Minekazu Sakai JP; Akira Kuroyanagi JP, Semiconductor memory device and method of manufacturing the same.
  44. Lancaster Loren T., Semiconductor non-volatile memory device having an improved write speed.
  45. Lancaster, Loren T., Semiconductor non-volatile memory device having an improved write speed.
  46. Kim, Hangeon, Single poly EEPROM having a tunnel oxide layer.
  47. Gupta, Suyog; Hekmatshoartabari, Bahman, Spatially decoupled floating gate semiconductor device.
  48. Gupta, Suyog; Hekmatshoartabari, Bahman, Spatially decoupled floating gate semiconductor device.
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  50. Buller James F. ; Bandyopadhyay Basab ; Garg Shyam ; Patel Nipendra J. ; Spikes ; Jr. Thomas E., Wafer cleaning procedure useful in the manufacture of a non-volatile memory device.
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