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Arrangement for illuminating and detecting parts in an image processing system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
출원번호 US-0387754 (1989-08-02)
우선권정보 DE-3827302 (1988-08-11)
발명자 / 주소
  • Poleschinski Richard (Munich DEX) Gerhard Detlef (Munich DEX)
출원인 / 주소
  • Siemens Aktiengesellschaft (Berlin and Munich DEX 03)
인용정보 피인용 횟수 : 48  인용 특허 : 4

초록

An optical pick-up device for image processing systems has an objective for generating an optical image of a subject to be registered, an image-to-signal transducer, particularly a CCD camera that converts the optical image into a video signal and an illumination device for illumination of the subje

대표청구항

An optical pick-up for use in an image processing system, said pick-up means comprising: objective means for generating an optical image of a subject, said objective means having an optical axis; semiconductor means for converting said optical image into electrical signals; illumination means for il

이 특허에 인용된 특허 (4)

  1. Ellinger Bernd (Regensburg DT), Apparatus for testing tops of containers for damage.
  2. Yoshida Hajime (Tokyo JPX), Bottle mouth defect inspection apparatus.
  3. Miyazawa Takashi (Urayasu JPX), Defect detecting method and apparatus.
  4. Ducloux Marcel (Le Pecq FRX), Method and apparatus for inspecting transparent objects.

이 특허를 인용한 특허 (48)

  1. Czyzewski, Zbigniew; Wadds, Nathan J.; Bajorins, David; Fox, Daniel; Jakuc, Maciej A., Bet sensing apparatuses and methods.
  2. Mandava, Ajay Kumar; Bemaras, Jaime, Bet sensing apparatuses and methods.
  3. Czyzewski, Zbigniew; Wadds, Nathan J.; Bajorins, David; Fox, Daniel; Jakuc, Maciej, Bet sensing apparatuses and related devices and methods.
  4. Czyzewski, Zbigniew; Wadds, Nathan; Bajorins, David; Fox, Daniel, Bet sensors.
  5. Czyzewski, Zbigniew; Wadds, Nathan; Bajorins, David; Fox, Daniel, Bet sensors, gaming tables with one or more bet sensors, and related methods.
  6. Messina, Michael C.; Driscoll, Thomas J.; O'Brien, Kyle M., Combination dark field and bright field illuminator.
  7. Messina, Michael C.; Driscoll, Thomas J.; O'Brien, Kyle M., Combination dark field and bright field illuminator.
  8. Messina, Michael C.; Driscoll, Thomas J.; O'Brien, Kyle M., Combination dark field and bright field illuminator.
  9. Robert Leo Hensley ; Tanakon Ungpiyakul, Detectable marks in trim material.
  10. Schwab, John W.; Liu, Gang; Michael, David J.; Wang, Lei, Direct illumination machine vision technique for processing semiconductor wafers.
  11. Nunnink, Laurens, Hand held symbology reader illumination diffuser.
  12. Nunnink, Laurens, Hand held symbology reader illumination diffuser.
  13. Flügge, Kai; Nunnink, Laurens, Hand held symbology reader illumination diffuser with aimer optics.
  14. Robert Leo Hensley ; Tanakon Ungpiyakul, Indirect registration of elements of web-derived product.
  15. Liu, Gang; Wang, Lei, Infrared direct illumination machine vision technique for semiconductor processing equipment.
  16. Bett Thomas Arthur ; Krueger-Justinger Jean Louise ; Ungpiyakul Tanakon, Infrared imaging to detect components on personal care articles.
  17. Bett, Thomas Arthur; Krueger-Justinger, Jean Louise; Ungpiyakul, Tanakon, Infrared imaging to detect components on personal care articles.
  18. Thomas Arthur Bett ; Jean Louise Krueger-Justinger ; Tanakon Ungpiyakul, Infrared imaging to detect components on personal care articles.
  19. Nunnink, Laurens; Equitz, William H, Integrated illumination assembly for symbology reader.
  20. Nunnink, Laurens; Equitz, William H, Integrated illumination assembly for symbology reader.
  21. Nunnink, Laurens; Equitz, William H., Integrated illumination assembly for symbology reader.
  22. Nunnink, Laurens; Equitz, William H., Integrated illumination assembly for symbology reader.
  23. Pastore, Timothy M, Lens protector.
  24. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesh, Light pipe illumination system and method.
  25. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesh, Light pipe illumination system and method.
  26. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesh, Light pipe illumination system and method.
  27. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesha, Light pipe illumination system and method.
  28. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesha, Light pipe illumination system and method.
  29. Nunnink, Laurens, Low profile illumination for direct part mark readers.
  30. Nunnink, Laurens, Low profile illumination for direct part mark readers.
  31. Nunnink, Laurens, Low profile illumination for direct part mark readers.
  32. Schwab, John W.; Liu, Gang; Michael, David J., Machine vision technique for manufacturing semiconductor wafers.
  33. Michael, David J.; Boatner, John B; Karnacewicz, Martin, Method and apparatus for backlighting a wafer during alignment.
  34. Chou Mau-Song ; Chodzko Richard A. ; Casement L. Suzanne ; Arenberg Jonathan W., Method and apparatus for inspection of a substrate by use of a ring illuminator.
  35. Mau-Song Chou ; Richard A. Chodzko ; L. Suzanne Casement ; Jonathan W. Arenberg, Method and apparatus for inspection of a substrate by use of a ring illuminator.
  36. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesh, Method and apparatus for providing omnidirectional lighting in a scanning device.
  37. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesha, Method and apparatus for providing omnidirectional lighting in a scanning device.
  38. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesha, Method and apparatus for providing omnidirectional lighting in a scanning device.
  39. Gerst, III, Carl W.; Equitz, William H.; Testa, Justin; Nadabar, Sateesha, Method and apparatus for providing omnidirectional lighting in a scanning device.
  40. Gerst, III, Carl W.; Equitz, William H; Testa, Justin; Nadahar, Sateesh, Method and apparatus for providing omnidirectional lighting in a scanning device.
  41. Beyerer, J?rgen; Seiraffi, Mohammed Ali, Method and apparatus for quality control in the manufacture of foundry cores or core packets.
  42. Michael, David J.; Clark, James; Liu, Gang, Method and apparatus for semiconductor wafer alignment.
  43. William Kelly IE, Ring lighting.
  44. Nettekoven, Michael P.; Cerny, Darin, Side light apparatus and method.
  45. Ehbets, Peter, Spectrophotometer and its use.
  46. Bryll,Robert K.; Ariga,Kozo, System and method for automatically recovering video tools in a vision system.
  47. Allen, Ross R., System and method for capturing document orientation information with a digital camera.
  48. Cooper Alan Neal, Video equipment and method to assist motor vehicle operators.
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