초록 ▼

A method of positioning a sample for X-Ray spectroanalysis at a spectroscopic machine that includes the steps of determining the point of primary focus of an X-Ray beam upon a master grid and then placing the data upon a mating assembly grid that is positioned in an assembly well into which is posit

A method of positioning a sample for X-Ray spectroanalysis at a spectroscopic machine that includes the steps of determining the point of primary focus of an X-Ray beam upon a master grid and then placing the data upon a mating assembly grid that is positioned in an assembly well into which is positioned a grid support that carries the assembly grid with the primary focus point. Further steps include assembling a sample holder with one sheet of film in the assembly well. An interlocking member that locks the sample holder into interlocking relationship with both the grid support and the sample holder is then inserted into the well. The sample is then aligned upon the point of primary focus upon the film in the fixed sample holder. The sample holder is removed from engagement with the interlocking member and transferred to the sample holder support plate at the spectroscopic machine where the sample is aligned with the primary focus. The sample holder can be optionally mounted with two sheets of film sandwiching the sample at the well.

대표청구항 ▼

A method of positioning a sample for X-Ray spectroscopic analysis at a spectroscopic machine having an X-Ray beam, comprising the following steps: (a) placing an assembly board having opposed top and bottom surfaces with the bottom surface upon a support surface, the board having a generally upright

A method of positioning a sample for X-Ray spectroscopic analysis at a spectroscopic machine having an X-Ray beam, comprising the following steps: (a) placing an assembly board having opposed top and bottom surfaces with the bottom surface upon a support surface, the board having a generally upright well means having an inner surface; (b) placing a grid support having an outer surface adapted to be sliding received by the inner surface of the well means into the well means, which is for receiving the grid support, the grid support having a top side and an upwardly facing assembly grid, the grid support and the assembly board including keying means for retaining the grid support in non-rotatable relationship with the assembly board and support means extending into the well means; (c) recording the point of primary focus data of said X-Ray beam onto a master grid; said X-Ray beam onto a master grid; (d) trasladintg the primary focus grid data at the master grid onto the assembly grid and marking the position thereon; (e) placing sample holder and interlocking means for retaining the sample holder in non-rotational relationship with the assembly board and with the grid support and assembly grid mounting at least one sheet of transparent film with a sample to be analyzed positioned in contact with the at least one film in the well means, which is for slidably receiving the interlocking means and the sample holder along the inner surface thereof, upon the grid support with the sample positioned over the assembly grid at the marked position of primary focus; the interlocking means being for retaining the sample holder in non-rotational relationship with the assembly board and with the grid support and the assembly grid; the support means at the well means being for bearing at least the sample holder and the interlocking means; (f) separating the sample holder with the sample from its relationship with the interlocking means; (g) removing the sample holder with the sample from the well means; and (h) placing the sample holder with the sample into position at a spectrometer supporting plate with the sample holder aligned with the supporting plate so that the sample is positioned at the point of primary focus.